Reliability physics: annual proceedings
Gespeichert in:
| Vorheriger Titel: | Reliability Physics Symposium Proceedings / Annual Reliability Physics Symposium. Institute of Electrical and Electronics Engineers |
|---|---|
| Format: | Tagungsbericht Zeitschrift |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
IEEE
1974-1989
|
| Schlagworte: | |
| Veröffentlicht: | 12.1974 - 27.1989 |
| ISSN: | 0735-0791 |
Internformat
MARC
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| 245 | 1 | 0 | |a Reliability physics |b annual proceedings |c International Reliability Physics Symposium. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| 247 | 1 | 0 | |a Annual reliability physics proceedings |f Nebent. 12.1974 |
| 264 | 3 | 1 | |a New York, NY |b IEEE |c 1974-1989 |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 362 | 0 | |a 12.1974 - 27.1989 | |
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| 363 | 1 | 0 | |8 1.2\x |a 27 |i 1989 |
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| 655 | 7 | |0 (DE-588)4067488-5 |a Zeitschrift |2 gnd-content | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | 1 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a IEEE Electron Devices Society |0 (DE-588)121920-0 |4 isb | |
| 711 | 2 | |a International Reliability Physics Symposium |0 (DE-588)242979-2 |4 isb | |
| 780 | 0 | 0 | |i Vorg.: |a Reliability Physics Symposium |t Proceedings / Annual Reliability Physics Symposium. Institute of Electrical and Electronics Engineers |d New York, NY, 1970-1973 |w (DE-604)BV010767842 |
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Datensatz im Suchindex
| _version_ | 1804116985600016384 |
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| building | Verbundindex |
| bvnumber | BV002596647 |
| ctrlnum | 627544-8 (OCoLC)630267943 (DE-599)ZDB627544-8 |
| dateSpan | 12.1974 - 27.1989 |
| format | Conference Proceeding Journal |
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| genre_facet | Zeitschrift Konferenzschrift |
| id | DE-604.BV002596647 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:47:12Z |
| institution | BVB |
| institution_GND | (DE-588)121920-0 (DE-588)242979-2 |
| issn | 0735-0791 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001671306 |
| oclc_num | 630267943 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-634 |
| owner_facet | DE-91 DE-BY-TUM DE-634 |
| publishDate | 1974 |
| publishDateSearch | 1974 1975 1976 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 1987 1988 1989 |
| publishDateSort | 1989 |
| publisher | IEEE |
| record_format | marc |
| spelling | Reliability physics annual proceedings International Reliability Physics Symposium. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society Annual reliability physics proceedings Nebent. 12.1974 New York, NY IEEE 1974-1989 txt rdacontent n rdamedia nc rdacarrier 12.1974 - 27.1989 1.1\x 12 1974 1.2\x 27 1989 Forts. als Monographie behandelt Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Zuverlässigkeit (DE-588)4059245-5 s Elektronik (DE-588)4014346-6 s DE-604 IEEE Electron Devices Society (DE-588)121920-0 isb International Reliability Physics Symposium (DE-588)242979-2 isb Vorg.: Reliability Physics Symposium Proceedings / Annual Reliability Physics Symposium. Institute of Electrical and Electronics Engineers New York, NY, 1970-1973 (DE-604)BV010767842 |
| spellingShingle | Reliability physics annual proceedings Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4067488-5 (DE-588)1071861417 |
| title | Reliability physics annual proceedings |
| title_auth | Reliability physics annual proceedings |
| title_exact_search | Reliability physics annual proceedings |
| title_full | Reliability physics annual proceedings International Reliability Physics Symposium. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| title_fullStr | Reliability physics annual proceedings International Reliability Physics Symposium. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| title_full_unstemmed | Reliability physics annual proceedings International Reliability Physics Symposium. Sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| title_old | Reliability Physics Symposium Proceedings / Annual Reliability Physics Symposium. Institute of Electrical and Electronics Engineers |
| title_short | Reliability physics |
| title_sort | reliability physics annual proceedings |
| title_sub | annual proceedings |
| topic | Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Elektronik Zuverlässigkeit Zeitschrift Konferenzschrift |
| work_keys_str_mv | AT ieeeelectrondevicessociety reliabilityphysicsannualproceedings AT internationalreliabilityphysicssymposium reliabilityphysicsannualproceedings AT ieeeelectrondevicessociety annualreliabilityphysicsproceedings AT internationalreliabilityphysicssymposium annualreliabilityphysicsproceedings |
| zdb_num | 627544-8 (DE-599)ZDB627544-8 |