Electronics reliability and micro-miniaturization:
Gespeichert in:
Späterer Titel: | Microelectronics reliability |
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Format: | Zeitschrift |
Sprache: | Undetermined |
Veröffentlicht: |
Oxford [u.a.]
Pergamon Pr.
1962-1963
|
Schlagworte: | |
Veröffentlicht: | 1.1962 - 2.1963 |
Beschreibung: | Repr.: Oxford : Pergamon Pr |
ISSN: | 0367-0902 0026-2714 |
Internformat
MARC
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210 | 1 | 0 | |a Electron. Reliab. Microminiaturization |2 din1502 |
245 | 1 | 0 | |a Electronics reliability and micro-miniaturization |
264 | 3 | 1 | |a Oxford [u.a.] |b Pergamon Pr. |c 1962-1963 |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
362 | 0 | |a 1.1962 - 2.1963 | |
363 | 0 | 0 | |8 1.1\x |a 1 |i 1962 |
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689 | 1 | |5 ZDB | |
776 | 0 | 8 | |i Online-Ausg. |t Microelectronics reliability |d Amsterdam [u.a.] : Elsevier, 1962- |h Online-Ressource |x 0026-2714 |w (DE-604)BV013476148 |
785 | 0 | 0 | |i Forts.: |t Microelectronics reliability |d Amsterdam [u.a.] : Elsevier, 1964- |x 0026-2714 |w (DE-604)BV002572914 |
999 | |a oai:aleph.bib-bvb.de:BVB01-001657724 |
Datensatz im Suchindex
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any_adam_object | |
building | Verbundindex |
bvnumber | BV002572915 |
classification_tum | ELT 240z |
ctrlnum | 240852-1 (OCoLC)311191001 (DE-599)ZDB240852-1 |
dateSpan | 1.1962 - 2.1963 |
discipline | Elektrotechnik |
format | Journal |
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genre | (DE-588)4067488-5 Zeitschrift gnd-content |
genre_facet | Zeitschrift |
id | DE-604.BV002572915 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:46:57Z |
institution | BVB |
issn | 0367-0902 0026-2714 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001657724 |
oclc_num | 311191001 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-29T DE-83 |
owner_facet | DE-91 DE-BY-TUM DE-29T DE-83 |
publishDate | 1962 |
publishDateSearch | 1962 1963 |
publishDateSort | 1963 |
publisher | Pergamon Pr. |
record_format | marc |
spelling | Electron. Reliab. Microminiaturization din1502 Electronics reliability and micro-miniaturization Oxford [u.a.] Pergamon Pr. 1962-1963 txt rdacontent n rdamedia nc rdacarrier 1.1962 - 2.1963 1.1\x 1 1962 1.2\x 2 1963 Repr.: Oxford : Pergamon Pr Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Zeitschrift (DE-588)4067488-5 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s Zeitschrift (DE-588)4067488-5 s DE-604 Elektronik (DE-588)4014346-6 s ZDB Online-Ausg. Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1962- Online-Ressource 0026-2714 (DE-604)BV013476148 Forts.: Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964- 0026-2714 (DE-604)BV002572914 |
spellingShingle | Electronics reliability and micro-miniaturization Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Zeitschrift (DE-588)4067488-5 gnd |
subject_GND | (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4039207-7 (DE-588)4067488-5 |
title | Electronics reliability and micro-miniaturization |
title_auth | Electronics reliability and micro-miniaturization |
title_exact_search | Electronics reliability and micro-miniaturization |
title_full | Electronics reliability and micro-miniaturization |
title_fullStr | Electronics reliability and micro-miniaturization |
title_full_unstemmed | Electronics reliability and micro-miniaturization |
title_new | Microelectronics reliability |
title_short | Electronics reliability and micro-miniaturization |
title_sort | electronics reliability and micro miniaturization |
topic | Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Zeitschrift (DE-588)4067488-5 gnd |
topic_facet | Elektronik Zuverlässigkeit Mikroelektronik Zeitschrift |
zdb_num | 240852-1 (DE-599)ZDB240852-1 |