Holdings: Microelectronics reliability

Microelectronics reliability: an internat. journal & world abstracting service

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Bibliographic Details
Previous Title:	Electronics reliability and micro-miniaturization
Format:	Journal
Language:	English
Published:	Amsterdam [u.a.] Elsevier 1964- Oxford [u.a.] Pergamon Press
Subjects:	Mikroelektronik Elektronik Zuverlässigkeit Zeitschrift
Published:	3.1964 -
Item Description:	Titelzusatz früher: An internat. journal & world abstracting service Repr.: Oxford : Pergamon Press
ISSN:	0026-2714 0367-0902

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MARC


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247	1	0	\|a Microelectronics and reliability \|f Hauptsacht. 3.1964 - 37.1997
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264	2	1	\|3 anfangs \|a Oxford [u.a.] \|b Pergamon Press
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780	0	0	\|i Vorg.: \|t Electronics reliability and micro-miniaturization \|d Oxford [u.a.] : Pergamon Pr., 1962-1963 \|x 0367-0902 \|w (DE-604)BV002572915
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787	0	8	\|i 14,2=1975; 15,Suppl.=1976; 17,1=1977; 19,1/2=1978; 20,1/2=1980 von \|a Canadian Reliability Symposium \|t Proceedings / Canadian Reliability Symposium. Society of Reliability Engineers \|d Oxford : Pergamon Pr., 1975-1980 \|w (DE-600)981116-3
787	0	8	\|i 15,4=1976; 16,4=1977; 18,1/2=1978 von \|t Semiconductor technology \|d Oxford ; Frankfurt, M. : Pergamon Pr., 1976-1978 \|w (DE-600)529840-4
787	0	8	\|i 19,5/6=1979; 21,3=1980; 21,6=1981 von \|t Semiconductor and microprocessor technology \|d Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1979- \|w (DE-600)1002342-2
787	0	8	\|i 24,2=12 von \|a Yugoslav Conference on Microelectronics \|t Review papers from the ... Yugoslav Conference on Microelectronics \|d Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1984- \|w (DE-600)1002347-1
787	0	8	\|i 32,11=1992; 33,11/12=1993; 35,3=1995; 36,7/8=1996; 37,7=1997 von \|t Reliability physics of advanced electron devices \|d Oxford : Pergamon, 1992- \|w (DE-604)BV021637492
943	1		\|a oai:aleph.bib-bvb.de:BVB01-001657723

Record in the Search Index

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bvnumber	BV002572914
classification_tum	ELT 240z
ctrlnum	240853-3 (OCoLC)1367286670 (DE-599)ZDB240853-3
dateSpan	3.1964 -
discipline	Elektrotechnik
format	Journal
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genre_facet	Zeitschrift
id	DE-604.BV002572914
illustrated	Illustrated
indexdate	2024-12-13T09:01:16Z
institution	BVB
issn	0026-2714 0367-0902
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-001657723
oclc_num	1367286670
open_access_boolean
owner	DE-91 DE-BY-TUM DE-29T DE-706 DE-83 DE-91G DE-BY-TUM
owner_facet	DE-91 DE-BY-TUM DE-29T DE-706 DE-83 DE-91G DE-BY-TUM
publishDate	1964
publishDateSearch	1964 1965 1966 1967 1968 1969 1970 1971 1972 1973 1974 1975 1976 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888
publishDateSort	2024
publisher	Elsevier Pergamon Press
record_format	marc
spelling	Microelectron. Reliab. din1502 Microelectron. a. Reliab. din1502 Microelectron. & Reliab. (GB) din1502 Microelectronics reliability An internat. journal & world abstracting service Microelectronics and reliability Hauptsacht. 3.1964 - 37.1997 Amsterdam [u.a.] Elsevier 1964- anfangs Oxford [u.a.] Pergamon Press txt rdacontent n rdamedia nc rdacarrier 3.1964 - 3 1964 Titelzusatz früher: An internat. journal & world abstracting service Repr.: Oxford : Pergamon Press Ab 2016 entfällt die Issue-Zählung Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Zeitschrift (DE-588)4067488-5 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s Zeitschrift (DE-588)4067488-5 s DE-604 Elektronik (DE-588)4014346-6 s ZDB Erscheint auch als Online-Ausgabe Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1962- Online-Ressource 0026-2714 (DE-604)BV013476148 Vorg.: Electronics reliability and micro-miniaturization Oxford [u.a.] : Pergamon Pr., 1962-1963 0367-0902 (DE-604)BV002572915 13,5=1974; 14,4=1975 von SEMINEX Technical Seminar and Exhibition Papers read at the SEMINEX Seminar Oxford ; Frankfurt, M. [u.a.] : Pergamon Pr., 1974-1975 (DE-600)580429-2 14,2=1975; 15,Suppl.=1976; 17,1=1977; 19,1/2=1978; 20,1/2=1980 von Canadian Reliability Symposium Proceedings / Canadian Reliability Symposium. Society of Reliability Engineers Oxford : Pergamon Pr., 1975-1980 (DE-600)981116-3 15,4=1976; 16,4=1977; 18,1/2=1978 von Semiconductor technology Oxford ; Frankfurt, M. : Pergamon Pr., 1976-1978 (DE-600)529840-4 19,5/6=1979; 21,3=1980; 21,6=1981 von Semiconductor and microprocessor technology Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1979- (DE-600)1002342-2 24,2=12 von Yugoslav Conference on Microelectronics Review papers from the ... Yugoslav Conference on Microelectronics Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1984- (DE-600)1002347-1 32,11=1992; 33,11/12=1993; 35,3=1995; 36,7/8=1996; 37,7=1997 von Reliability physics of advanced electron devices Oxford : Pergamon, 1992- (DE-604)BV021637492
spellingShingle	Microelectronics reliability Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Zeitschrift (DE-588)4067488-5 gnd
subject_GND	(DE-588)4039207-7 (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4067488-5
title	Microelectronics reliability
title_alt	An internat. journal & world abstracting service
title_auth	Microelectronics reliability
title_exact_search	Microelectronics reliability
title_full	Microelectronics reliability
title_fullStr	Microelectronics reliability
title_full_unstemmed	Microelectronics reliability
title_old	Electronics reliability and micro-miniaturization
title_short	Microelectronics reliability
title_sort	microelectronics reliability
title_sub	an internat. journal & world abstracting service
topic	Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Zeitschrift (DE-588)4067488-5 gnd
topic_facet	Mikroelektronik Elektronik Zuverlässigkeit Zeitschrift
zdb_num	240853-3 (DE-599)ZDB240853-3

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