Microelectronics reliability: an internat. journal & world abstracting service
Gespeichert in:
| Vorheriger Titel: | Electronics reliability and micro-miniaturization |
|---|---|
| Format: | Zeitschrift |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
1964-
Oxford [u.a.] Pergamon Press |
| Schlagworte: | |
| Veröffentlicht: | 3.1964 - |
| Beschreibung: | Titelzusatz früher: An internat. journal & world abstracting service Repr.: Oxford : Pergamon Press |
| ISSN: | 0026-2714 0367-0902 |
Internformat
MARC
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| 246 | 1 | 3 | |a An internat. journal & world abstracting service |
| 247 | 1 | 0 | |a Microelectronics and reliability |f Hauptsacht. 3.1964 - 37.1997 |
| 264 | 3 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 1964- |
| 264 | 2 | 1 | |3 anfangs |a Oxford [u.a.] |b Pergamon Press |
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| 500 | |a Repr.: Oxford : Pergamon Press | ||
| 515 | |a Ab 2016 entfällt die Issue-Zählung | ||
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| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |t Microelectronics reliability |d Amsterdam [u.a.] : Elsevier, 1962- |h Online-Ressource |x 0026-2714 |w (DE-604)BV013476148 |
| 780 | 0 | 0 | |i Vorg.: |t Electronics reliability and micro-miniaturization |d Oxford [u.a.] : Pergamon Pr., 1962-1963 |x 0367-0902 |w (DE-604)BV002572915 |
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| 787 | 0 | 8 | |i 14,2=1975; 15,Suppl.=1976; 17,1=1977; 19,1/2=1978; 20,1/2=1980 von |a Canadian Reliability Symposium |t Proceedings / Canadian Reliability Symposium. Society of Reliability Engineers |d Oxford : Pergamon Pr., 1975-1980 |w (DE-600)981116-3 |
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| 787 | 0 | 8 | |i 19,5/6=1979; 21,3=1980; 21,6=1981 von |t Semiconductor and microprocessor technology |d Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1979- |w (DE-600)1002342-2 |
| 787 | 0 | 8 | |i 24,2=12 von |a Yugoslav Conference on Microelectronics |t Review papers from the ... Yugoslav Conference on Microelectronics |d Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1984- |w (DE-600)1002347-1 |
| 787 | 0 | 8 | |i 32,11=1992; 33,11/12=1993; 35,3=1995; 36,7/8=1996; 37,7=1997 von |t Reliability physics of advanced electron devices |d Oxford : Pergamon, 1992- |w (DE-604)BV021637492 |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-001657723 | |
Datensatz im Suchindex
| _version_ | 1818315169964490752 |
|---|---|
| adam_text | |
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002572914 |
| classification_tum | ELT 240z |
| ctrlnum | 240853-3 (OCoLC)1367286670 (DE-599)ZDB240853-3 |
| dateSpan | 3.1964 - |
| discipline | Elektrotechnik |
| format | Journal |
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| genre | (DE-588)4067488-5 Zeitschrift gnd-content |
| genre_facet | Zeitschrift |
| id | DE-604.BV002572914 |
| illustrated | Illustrated |
| indexdate | 2024-12-13T09:01:16Z |
| institution | BVB |
| issn | 0026-2714 0367-0902 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001657723 |
| oclc_num | 1367286670 |
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| owner_facet | DE-91 DE-BY-TUM DE-29T DE-706 DE-83 DE-91G DE-BY-TUM |
| publishDate | 1964 |
| publishDateSearch | 1964 1965 1966 1967 1968 1969 1970 1971 1972 1973 1974 1975 1976 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 8888 |
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| spelling | Microelectron. Reliab. din1502 Microelectron. a. Reliab. din1502 Microelectron. & Reliab. (GB) din1502 Microelectronics reliability An internat. journal & world abstracting service Microelectronics and reliability Hauptsacht. 3.1964 - 37.1997 Amsterdam [u.a.] Elsevier 1964- anfangs Oxford [u.a.] Pergamon Press txt rdacontent n rdamedia nc rdacarrier 3.1964 - 3 1964 Titelzusatz früher: An internat. journal & world abstracting service Repr.: Oxford : Pergamon Press Ab 2016 entfällt die Issue-Zählung Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Zeitschrift (DE-588)4067488-5 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s Zeitschrift (DE-588)4067488-5 s DE-604 Elektronik (DE-588)4014346-6 s ZDB Erscheint auch als Online-Ausgabe Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1962- Online-Ressource 0026-2714 (DE-604)BV013476148 Vorg.: Electronics reliability and micro-miniaturization Oxford [u.a.] : Pergamon Pr., 1962-1963 0367-0902 (DE-604)BV002572915 13,5=1974; 14,4=1975 von SEMINEX Technical Seminar and Exhibition Papers read at the SEMINEX Seminar Oxford ; Frankfurt, M. [u.a.] : Pergamon Pr., 1974-1975 (DE-600)580429-2 14,2=1975; 15,Suppl.=1976; 17,1=1977; 19,1/2=1978; 20,1/2=1980 von Canadian Reliability Symposium Proceedings / Canadian Reliability Symposium. Society of Reliability Engineers Oxford : Pergamon Pr., 1975-1980 (DE-600)981116-3 15,4=1976; 16,4=1977; 18,1/2=1978 von Semiconductor technology Oxford ; Frankfurt, M. : Pergamon Pr., 1976-1978 (DE-600)529840-4 19,5/6=1979; 21,3=1980; 21,6=1981 von Semiconductor and microprocessor technology Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1979- (DE-600)1002342-2 24,2=12 von Yugoslav Conference on Microelectronics Review papers from the ... Yugoslav Conference on Microelectronics Oxford ; Frankfurt [u.a.] : Pergamon Pr., 1984- (DE-600)1002347-1 32,11=1992; 33,11/12=1993; 35,3=1995; 36,7/8=1996; 37,7=1997 von Reliability physics of advanced electron devices Oxford : Pergamon, 1992- (DE-604)BV021637492 |
| spellingShingle | Microelectronics reliability Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Zeitschrift (DE-588)4067488-5 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)4067488-5 |
| title | Microelectronics reliability |
| title_alt | An internat. journal & world abstracting service |
| title_auth | Microelectronics reliability |
| title_exact_search | Microelectronics reliability |
| title_full | Microelectronics reliability |
| title_fullStr | Microelectronics reliability |
| title_full_unstemmed | Microelectronics reliability |
| title_old | Electronics reliability and micro-miniaturization |
| title_short | Microelectronics reliability |
| title_sort | microelectronics reliability |
| title_sub | an internat. journal & world abstracting service |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Zeitschrift (DE-588)4067488-5 gnd |
| topic_facet | Mikroelektronik Elektronik Zuverlässigkeit Zeitschrift |
| zdb_num | 240853-3 (DE-599)ZDB240853-3 |