On the automatic generation of test patterns from mixed-level hardware descriptions:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
1989
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| Schlagworte: | |
| Beschreibung: | Kaiserslautern, Univ., Diss. |
| Beschreibung: | 256 S. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV002495590 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 900226s1989 m||| 00||| engod | ||
| 035 | |a (OCoLC)46213022 | ||
| 035 | |a (DE-599)BVBBV002495590 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 | ||
| 100 | 1 | |a Wodtko, Andrea |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a On the automatic generation of test patterns from mixed-level hardware descriptions |
| 264 | 1 | |c 1989 | |
| 300 | |a 256 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Kaiserslautern, Univ., Diss. | ||
| 650 | 7 | |a Algorithmus |2 swd | |
| 650 | 7 | |a Mustererkennung |2 swd | |
| 650 | 7 | |a Test |2 swd | |
| 650 | 7 | |a VLSI |2 swd | |
| 650 | 0 | 7 | |a Testmustergenerator |0 (DE-588)4210166-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a KARATE |g Programm |0 (DE-588)4225668-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Implementierung |g Informatik |0 (DE-588)4026663-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Testmustergenerator |0 (DE-588)4210166-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a KARATE |g Programm |0 (DE-588)4225668-9 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Testmustergenerator |0 (DE-588)4210166-9 |D s |
| 689 | 3 | 1 | |a Implementierung |g Informatik |0 (DE-588)4026663-1 |D s |
| 689 | 3 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001607664 | ||
Datensatz im Suchindex
| _version_ | 1804116902116589568 |
|---|---|
| any_adam_object | |
| author | Wodtko, Andrea |
| author_facet | Wodtko, Andrea |
| author_role | aut |
| author_sort | Wodtko, Andrea |
| author_variant | a w aw |
| building | Verbundindex |
| bvnumber | BV002495590 |
| ctrlnum | (OCoLC)46213022 (DE-599)BVBBV002495590 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01637nam a2200493 c 4500</leader><controlfield tag="001">BV002495590</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">900226s1989 m||| 00||| engod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)46213022</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002495590</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wodtko, Andrea</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">On the automatic generation of test patterns from mixed-level hardware descriptions</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">256 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Kaiserslautern, Univ., Diss.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Algorithmus</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Test</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">VLSI</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">KARATE</subfield><subfield code="g">Programm</subfield><subfield code="0">(DE-588)4225668-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Implementierung</subfield><subfield code="g">Informatik</subfield><subfield code="0">(DE-588)4026663-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">KARATE</subfield><subfield code="g">Programm</subfield><subfield code="0">(DE-588)4225668-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Testmustergenerator</subfield><subfield code="0">(DE-588)4210166-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Implementierung</subfield><subfield code="g">Informatik</subfield><subfield code="0">(DE-588)4026663-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001607664</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV002495590 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:45:53Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001607664 |
| oclc_num | 46213022 |
| open_access_boolean | |
| owner | DE-12 |
| owner_facet | DE-12 |
| physical | 256 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| record_format | marc |
| spelling | Wodtko, Andrea Verfasser aut On the automatic generation of test patterns from mixed-level hardware descriptions 1989 256 S. txt rdacontent n rdamedia nc rdacarrier Kaiserslautern, Univ., Diss. Algorithmus swd Mustererkennung swd Test swd VLSI swd Testmustergenerator (DE-588)4210166-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf KARATE Programm (DE-588)4225668-9 gnd rswk-swf Implementierung Informatik (DE-588)4026663-1 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 Testmustergenerator (DE-588)4210166-9 s KARATE Programm (DE-588)4225668-9 s Implementierung Informatik (DE-588)4026663-1 s |
| spellingShingle | Wodtko, Andrea On the automatic generation of test patterns from mixed-level hardware descriptions Algorithmus swd Mustererkennung swd Test swd VLSI swd Testmustergenerator (DE-588)4210166-9 gnd Prüftechnik (DE-588)4047610-8 gnd KARATE Programm (DE-588)4225668-9 gnd Implementierung Informatik (DE-588)4026663-1 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4210166-9 (DE-588)4047610-8 (DE-588)4225668-9 (DE-588)4026663-1 (DE-588)4117388-0 (DE-588)4113937-9 |
| title | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_auth | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_exact_search | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_full | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_fullStr | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_full_unstemmed | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_short | On the automatic generation of test patterns from mixed-level hardware descriptions |
| title_sort | on the automatic generation of test patterns from mixed level hardware descriptions |
| topic | Algorithmus swd Mustererkennung swd Test swd VLSI swd Testmustergenerator (DE-588)4210166-9 gnd Prüftechnik (DE-588)4047610-8 gnd KARATE Programm (DE-588)4225668-9 gnd Implementierung Informatik (DE-588)4026663-1 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Algorithmus Mustererkennung Test VLSI Testmustergenerator Prüftechnik KARATE Programm Implementierung Informatik Hochschulschrift |
| work_keys_str_mv | AT wodtkoandrea ontheautomaticgenerationoftestpatternsfrommixedlevelhardwaredescriptions |