Particle characterization in technology:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Boca Raton, Fla.
CRC Pr.
|
| Schriftenreihe: | CRC series on fine particle science and technology.
|
| Schlagworte: |
Internformat
MARC
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| 084 | |a CIT 290f |2 stub | ||
| 245 | 1 | 0 | |a Particle characterization in technology |c ed.: John Keith Beddow |
| 264 | 1 | |a Boca Raton, Fla. |b CRC Pr. | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a CRC series on fine particle science and technology. | |
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| 689 | 0 | 0 | |a Korngrößenanalyse |0 (DE-588)4165322-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Beddow, John Keith |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012152114 | ||
Datensatz im Suchindex
| _version_ | 1804131990485598208 |
|---|---|
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| building | Verbundindex |
| bvnumber | BV002349412 |
| classification_rvk | UQ 8050 |
| classification_tum | CIT 290f |
| ctrlnum | (DE-599)BVBBV002349412 |
| discipline | Physik Chemie-Ingenieurwesen |
| format | Book |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:45:42Z |
| institution | BVB |
| language | Undetermined |
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| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | CRC Pr. |
| record_format | marc |
| series2 | CRC series on fine particle science and technology. |
| spelling | Particle characterization in technology ed.: John Keith Beddow Boca Raton, Fla. CRC Pr. txt rdacontent n rdamedia nc rdacarrier CRC series on fine particle science and technology. Korngrößenanalyse (DE-588)4165322-1 gnd rswk-swf Korngrößenanalyse (DE-588)4165322-1 s DE-604 Beddow, John Keith Sonstige oth |
| spellingShingle | Particle characterization in technology Korngrößenanalyse (DE-588)4165322-1 gnd |
| subject_GND | (DE-588)4165322-1 |
| title | Particle characterization in technology |
| title_auth | Particle characterization in technology |
| title_exact_search | Particle characterization in technology |
| title_full | Particle characterization in technology ed.: John Keith Beddow |
| title_fullStr | Particle characterization in technology ed.: John Keith Beddow |
| title_full_unstemmed | Particle characterization in technology ed.: John Keith Beddow |
| title_short | Particle characterization in technology |
| title_sort | particle characterization in technology |
| topic | Korngrößenanalyse (DE-588)4165322-1 gnd |
| topic_facet | Korngrößenanalyse |
| work_keys_str_mv | AT beddowjohnkeith particlecharacterizationintechnology |