Point defects in semiconductors: 2 Experimental aspects
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1983
|
| Schriftenreihe: | Springer series in solid-state sciences
35 |
| Schlagworte: | |
| Beschreibung: | XVI, 295 S. |
| ISBN: | 3540115153 0387115153 |
Internformat
MARC
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| 100 | 1 | |a Lannoo, Michel |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Point defects in semiconductors |n 2 |p Experimental aspects |c J. Bourgoin ; M. Lannoo |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 1983 | |
| 300 | |a XVI, 295 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 650 | 4 | |a Point defects | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 700 | 1 | |a Bourgoin, Jacques |e Verfasser |4 aut | |
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| 830 | 0 | |a Springer series in solid-state sciences |v 35 |w (DE-604)BV000016582 |9 35 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001525316 | ||
Datensatz im Suchindex
| _version_ | 1804116783197585408 |
|---|---|
| any_adam_object | |
| author | Lannoo, Michel Bourgoin, Jacques |
| author_facet | Lannoo, Michel Bourgoin, Jacques |
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| author_sort | Lannoo, Michel |
| author_variant | m l ml j b jb |
| building | Verbundindex |
| bvnumber | BV002329486 |
| ctrlnum | (OCoLC)277151983 (DE-599)BVBBV002329486 |
| format | Book |
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| id | DE-604.BV002329486 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:43:59Z |
| institution | BVB |
| isbn | 3540115153 0387115153 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001525316 |
| oclc_num | 277151983 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM DE-384 DE-703 DE-824 DE-355 DE-BY-UBR DE-29T DE-188 DE-20 |
| owner_facet | DE-91G DE-BY-TUM DE-384 DE-703 DE-824 DE-355 DE-BY-UBR DE-29T DE-188 DE-20 |
| physical | XVI, 295 S. |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in solid-state sciences |
| series2 | Springer series in solid-state sciences |
| spelling | Lannoo, Michel Verfasser aut Point defects in semiconductors 2 Experimental aspects J. Bourgoin ; M. Lannoo Berlin [u.a.] Springer 1983 XVI, 295 S. txt rdacontent n rdamedia nc rdacarrier Springer series in solid-state sciences 35 Springer series in solid-state sciences ... Point defects Semiconductors Defects Bourgoin, Jacques Verfasser aut (DE-604)BV002329483 2 Springer series in solid-state sciences 35 (DE-604)BV000016582 35 |
| spellingShingle | Lannoo, Michel Bourgoin, Jacques Point defects in semiconductors Springer series in solid-state sciences Point defects Semiconductors Defects |
| title | Point defects in semiconductors |
| title_auth | Point defects in semiconductors |
| title_exact_search | Point defects in semiconductors |
| title_full | Point defects in semiconductors 2 Experimental aspects J. Bourgoin ; M. Lannoo |
| title_fullStr | Point defects in semiconductors 2 Experimental aspects J. Bourgoin ; M. Lannoo |
| title_full_unstemmed | Point defects in semiconductors 2 Experimental aspects J. Bourgoin ; M. Lannoo |
| title_short | Point defects in semiconductors |
| title_sort | point defects in semiconductors experimental aspects |
| topic | Point defects Semiconductors Defects |
| topic_facet | Point defects Semiconductors Defects |
| volume_link | (DE-604)BV002329483 (DE-604)BV000016582 |
| work_keys_str_mv | AT lannoomichel pointdefectsinsemiconductors2 AT bourgoinjacques pointdefectsinsemiconductors2 |