Point defects in semiconductors: 1 Theoretical aspects
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1981
|
| Schriftenreihe: | Springer series in solid-state sciences
22 |
| Schlagworte: | |
| Beschreibung: | XVII, 265 S. |
| ISBN: | 3540105182 0387105182 |
Internformat
MARC
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| 100 | 1 | |a Lannoo, Michel |e Verfasser |4 aut | |
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| 300 | |a XVII, 265 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-001525315 | ||
Datensatz im Suchindex
| _version_ | 1804116783173468160 |
|---|---|
| any_adam_object | |
| author | Lannoo, Michel Bourgoin, Jacques |
| author_facet | Lannoo, Michel Bourgoin, Jacques |
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| author_sort | Lannoo, Michel |
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| bvnumber | BV002329484 |
| ctrlnum | (OCoLC)40634251 (DE-599)BVBBV002329484 |
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| id | DE-604.BV002329484 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:43:59Z |
| institution | BVB |
| isbn | 3540105182 0387105182 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001525315 |
| oclc_num | 40634251 |
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| owner_facet | DE-91G DE-BY-TUM DE-384 DE-703 DE-20 DE-355 DE-BY-UBR DE-29T DE-188 |
| physical | XVII, 265 S. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in solid-state sciences |
| series2 | Springer series in solid-state sciences |
| spelling | Lannoo, Michel Verfasser aut Point defects in semiconductors 1 Theoretical aspects J. Bourgoin ; M. Lannoo Berlin [u.a.] Springer 1981 XVII, 265 S. txt rdacontent n rdamedia nc rdacarrier Springer series in solid-state sciences 22 Springer series in solid-state sciences ... Semiconducteurs - Défauts ram Semiconducteurs ram Bourgoin, Jacques Verfasser aut (DE-604)BV002329483 1 Springer series in solid-state sciences 22 (DE-604)BV000016582 22 |
| spellingShingle | Lannoo, Michel Bourgoin, Jacques Point defects in semiconductors Springer series in solid-state sciences Semiconducteurs - Défauts ram Semiconducteurs ram |
| title | Point defects in semiconductors |
| title_auth | Point defects in semiconductors |
| title_exact_search | Point defects in semiconductors |
| title_full | Point defects in semiconductors 1 Theoretical aspects J. Bourgoin ; M. Lannoo |
| title_fullStr | Point defects in semiconductors 1 Theoretical aspects J. Bourgoin ; M. Lannoo |
| title_full_unstemmed | Point defects in semiconductors 1 Theoretical aspects J. Bourgoin ; M. Lannoo |
| title_short | Point defects in semiconductors |
| title_sort | point defects in semiconductors theoretical aspects |
| topic | Semiconducteurs - Défauts ram Semiconducteurs ram |
| topic_facet | Semiconducteurs - Défauts Semiconducteurs |
| volume_link | (DE-604)BV002329483 (DE-604)BV000016582 |
| work_keys_str_mv | AT lannoomichel pointdefectsinsemiconductors1 AT bourgoinjacques pointdefectsinsemiconductors1 |