Point defects in semiconductors:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
|
| Schriftenreihe: | Springer series in solid-state sciences
... |
| Schlagworte: | |
| ISBN: | 3540105182 0387105182 3540115153 |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1804131986523029504 |
|---|---|
| any_adam_object | |
| author | Lannoo, Michel Bourgoin, Jacques |
| author_facet | Lannoo, Michel Bourgoin, Jacques |
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| author_sort | Lannoo, Michel |
| author_variant | m l ml j b jb |
| building | Verbundindex |
| bvnumber | BV002329483 |
| classification_rvk | UP 1090 UP 2100 |
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| format | Book |
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| id | DE-604.BV002329483 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:45:38Z |
| institution | BVB |
| isbn | 3540105182 0387105182 3540115153 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012149160 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer series in solid-state sciences |
| spelling | Lannoo, Michel Verfasser aut Point defects in semiconductors J. Bourgoin ; M. Lannoo Berlin [u.a.] Springer txt rdacontent n rdamedia nc rdacarrier Springer series in solid-state sciences ... Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Störstelle (DE-588)4193400-3 s DE-604 Bourgoin, Jacques Verfasser aut |
| spellingShingle | Lannoo, Michel Bourgoin, Jacques Point defects in semiconductors Störstelle (DE-588)4193400-3 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4193400-3 (DE-588)4022993-2 |
| title | Point defects in semiconductors |
| title_auth | Point defects in semiconductors |
| title_exact_search | Point defects in semiconductors |
| title_full | Point defects in semiconductors J. Bourgoin ; M. Lannoo |
| title_fullStr | Point defects in semiconductors J. Bourgoin ; M. Lannoo |
| title_full_unstemmed | Point defects in semiconductors J. Bourgoin ; M. Lannoo |
| title_short | Point defects in semiconductors |
| title_sort | point defects in semiconductors |
| topic | Störstelle (DE-588)4193400-3 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Störstelle Halbleiter |
| work_keys_str_mv | AT lannoomichel pointdefectsinsemiconductors AT bourgoinjacques pointdefectsinsemiconductors |