Electronics reliability and measurement technology: nondestructive evaluation
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Park Ridge, NJ
Noyes Data Corp.
1988
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XII, 128 S. Ill., graph. Darst. |
| ISBN: | 081551171X |
Internformat
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| 245 | 1 | 0 | |a Electronics reliability and measurement technology |b nondestructive evaluation |c ed. by Joseph S. Heyman |
| 264 | 1 | |a Park Ridge, NJ |b Noyes Data Corp. |c 1988 | |
| 300 | |a XII, 128 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Integrated circuits |x Reliability |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 650 | 4 | |a Nondestructive testing |v Congresses | |
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| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
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| 711 | 2 | |a Electronics Reliability and Measurement Technology Workshop |d 1986 |c Hampton, Va. |j Sonstige |0 (DE-588)670898-5 |4 oth | |
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Datensatz im Suchindex
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| bvnumber | BV002293789 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4040 |
| classification_tum | ELT 240f |
| ctrlnum | (OCoLC)18382835 (DE-599)BVBBV002293789 |
| dewey-full | 621.381/028/7 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/028/7 |
| dewey-search | 621.381/028/7 |
| dewey-sort | 3621.381 228 17 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content |
| genre_facet | Konferenzschrift 1986 Hampton Va. |
| id | DE-604.BV002293789 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:43:31Z |
| institution | BVB |
| institution_GND | (DE-588)670898-5 |
| isbn | 081551171X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001507401 |
| oclc_num | 18382835 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-29T |
| physical | XII, 128 S. Ill., graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Noyes Data Corp. |
| record_format | marc |
| spelling | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman Park Ridge, NJ Noyes Data Corp. 1988 XII, 128 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Nondestructive testing Congresses Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Hampton Va. gnd-content Zuverlässigkeit (DE-588)4059245-5 s Elektronik (DE-588)4014346-6 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Heyman, Joseph S. Sonstige oth Electronics Reliability and Measurement Technology Workshop 1986 Hampton, Va. Sonstige (DE-588)670898-5 oth |
| spellingShingle | Electronics reliability and measurement technology nondestructive evaluation Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Nondestructive testing Congresses Elektronische Schaltung (DE-588)4113419-9 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4014346-6 (DE-588)4059245-5 (DE-588)1071861417 |
| title | Electronics reliability and measurement technology nondestructive evaluation |
| title_auth | Electronics reliability and measurement technology nondestructive evaluation |
| title_exact_search | Electronics reliability and measurement technology nondestructive evaluation |
| title_full | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_fullStr | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_full_unstemmed | Electronics reliability and measurement technology nondestructive evaluation ed. by Joseph S. Heyman |
| title_short | Electronics reliability and measurement technology |
| title_sort | electronics reliability and measurement technology nondestructive evaluation |
| title_sub | nondestructive evaluation |
| topic | Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Nondestructive testing Congresses Elektronische Schaltung (DE-588)4113419-9 gnd Elektronik (DE-588)4014346-6 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Nondestructive testing Congresses Elektronische Schaltung Elektronik Zuverlässigkeit Konferenzschrift 1986 Hampton Va. |
| work_keys_str_mv | AT heymanjosephs electronicsreliabilityandmeasurementtechnologynondestructiveevaluation AT electronicsreliabilityandmeasurementtechnologyworkshophamptonva electronicsreliabilityandmeasurementtechnologynondestructiveevaluation |