Verfügbarkeit: LSI VLSI testability design

LSI VLSI testability design:

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Bibliographische Detailangaben
1. Verfasser:	Tsui, Frank Fang (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	New York u.a. McGraw-Hill 1987
Schlagworte:	Integrated circuits > Large scale integration > Testing Integrated circuits > Very large scale integration > Testing Prüftechnik LSI Integrierte Schaltung VLSI Entwurf Schaltungsentwurf Testen
Beschreibung:	Literaturangaben
Beschreibung:	XV, 702 S. graph. Darst.
ISBN:	0070653410

Internformat

MARC


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Datensatz im Suchindex

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author	Tsui, Frank Fang
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dewey-tens	620 - Engineering and allied operations
discipline	Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik
format	Book
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illustrated	Illustrated
indexdate	2024-07-09T15:43:28Z
institution	BVB
isbn	0070653410
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-001505383
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owner_facet	DE-91 DE-BY-TUM DE-92 DE-739
physical	XV, 702 S. graph. Darst.
publishDate	1987
publishDateSearch	1987
publishDateSort	1987
publisher	McGraw-Hill
record_format	marc
spelling	Tsui, Frank Fang Verfasser aut LSI VLSI testability design New York u.a. McGraw-Hill 1987 XV, 702 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd rswk-swf LSI (DE-588)4168200-2 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Entwurf (DE-588)4121208-3 s Prüftechnik (DE-588)4047610-8 s DE-604 LSI (DE-588)4168200-2 s Testen (DE-588)4367264-4 s 1\p DE-604 VLSI (DE-588)4117388-0 s 2\p DE-604 Schaltungsentwurf (DE-588)4179389-4 s 3\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Tsui, Frank Fang LSI VLSI testability design Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd LSI (DE-588)4168200-2 gnd Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd Entwurf (DE-588)4121208-3 gnd Schaltungsentwurf (DE-588)4179389-4 gnd Testen (DE-588)4367264-4 gnd
subject_GND	(DE-588)4047610-8 (DE-588)4168200-2 (DE-588)4027242-4 (DE-588)4117388-0 (DE-588)4121208-3 (DE-588)4179389-4 (DE-588)4367264-4
title	LSI VLSI testability design
title_auth	LSI VLSI testability design
title_exact_search	LSI VLSI testability design
title_full	LSI VLSI testability design
title_fullStr	LSI VLSI testability design
title_full_unstemmed	LSI VLSI testability design
title_short	LSI VLSI testability design
title_sort	lsi vlsi testability design
topic	Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd LSI (DE-588)4168200-2 gnd Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd Entwurf (DE-588)4121208-3 gnd Schaltungsentwurf (DE-588)4179389-4 gnd Testen (DE-588)4367264-4 gnd
topic_facet	Integrated circuits Large scale integration Testing Integrated circuits Very large scale integration Testing Prüftechnik LSI Integrierte Schaltung VLSI Entwurf Schaltungsentwurf Testen
work_keys_str_mv	AT tsuifrankfang lsivlsitestabilitydesign

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