IEEE standard for semiconductor memory test pattern language:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
1986
|
| Schriftenreihe: | Institute of Electrical and Electronics Engineers: IEEE Standards.
660. |
| Schlagworte: | |
| Beschreibung: | 12 S. |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:43:28Z |
| institution | BVB |
| institution_GND | (DE-588)1692-5 |
| language | English |
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| physical | 12 S. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
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| series | Institute of Electrical and Electronics Engineers: IEEE Standards. |
| series2 | Institute of Electrical and Electronics Engineers: IEEE Standards. |
| spelling | Institute of Electrical and Electronics Engineers Verfasser (DE-588)1692-5 aut IEEE standard for semiconductor memory test pattern language New York, NY 1986 12 S. txt rdacontent n rdamedia nc rdacarrier Institute of Electrical and Electronics Engineers: IEEE Standards. 660. Semiconductor storage devices Standards Institute of Electrical and Electronics Engineers: IEEE Standards. 660. (DE-604)BV001900771 660. |
| spellingShingle | IEEE standard for semiconductor memory test pattern language Institute of Electrical and Electronics Engineers: IEEE Standards. Semiconductor storage devices Standards |
| title | IEEE standard for semiconductor memory test pattern language |
| title_auth | IEEE standard for semiconductor memory test pattern language |
| title_exact_search | IEEE standard for semiconductor memory test pattern language |
| title_full | IEEE standard for semiconductor memory test pattern language |
| title_fullStr | IEEE standard for semiconductor memory test pattern language |
| title_full_unstemmed | IEEE standard for semiconductor memory test pattern language |
| title_short | IEEE standard for semiconductor memory test pattern language |
| title_sort | ieee standard for semiconductor memory test pattern language |
| topic | Semiconductor storage devices Standards |
| topic_facet | Semiconductor storage devices Standards |
| volume_link | (DE-604)BV001900771 |
| work_keys_str_mv | AT instituteofelectricalandelectronicsengineers ieeestandardforsemiconductormemorytestpatternlanguage |