Scanned image microscopy:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
London u.a.
Acad. Pr.
1980
|
Schriftenreihe: | Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia
1980 |
Schlagworte: | |
Beschreibung: | XV, 461 S. Ill., graph. Darst. |
ISBN: | 0120651807 |
Internformat
MARC
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245 | 1 | 0 | |a Scanned image microscopy |c ed. by Eric A. Ash |
264 | 1 | |a London u.a. |b Acad. Pr. |c 1980 | |
300 | |a XV, 461 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia |v 1980 | |
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650 | 4 | |a Microscopes électroniques à balayage - Congrès | |
650 | 7 | |a Microscopie - Congrès |2 ram | |
650 | 7 | |a Systèmes à balayage - Congrès |2 ram | |
650 | 4 | |a Scanning electron microscopy |v Congresses | |
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Datensatz im Suchindex
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adam_text | |
any_adam_object | |
building | Verbundindex |
bvnumber | BV002284983 |
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ctrlnum | (OCoLC)7197383 (DE-599)BVBBV002284983 |
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dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8/25 |
dewey-search | 502/.8/25 |
dewey-sort | 3502 18 225 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Chemie |
format | Book |
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genre | (DE-588)1071861417 Konferenzschrift 1980 London gnd-content Scanningmethode gnd |
genre_facet | Konferenzschrift 1980 London Scanningmethode |
id | DE-604.BV002284983 |
illustrated | Illustrated |
indexdate | 2024-11-14T17:00:35Z |
institution | BVB |
isbn | 0120651807 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001501702 |
oclc_num | 7197383 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-384 DE-29T DE-706 |
owner_facet | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-384 DE-29T DE-706 |
physical | XV, 461 S. Ill., graph. Darst. |
publishDate | 1980 |
publishDateSearch | 1980 |
publishDateSort | 1980 |
publisher | Acad. Pr. |
record_format | marc |
series | Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia |
series2 | Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia |
spelling | Scanned image microscopy ed. by Eric A. Ash London u.a. Acad. Pr. 1980 XV, 461 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia 1980 Elektronenmicroscopie gtt Microscopes électroniques à balayage - Congrès Microscopie - Congrès ram Systèmes à balayage - Congrès ram Scanning electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1980 London gnd-content Scanningmethode gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Scanningmethode f Ash, Eric A. Sonstige oth Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia 1980 (DE-604)BV001901157 1980 |
spellingShingle | Scanned image microscopy Rank Prize Funds: The Rank Prize Funds opto-electronics biennial symposia Elektronenmicroscopie gtt Microscopes électroniques à balayage - Congrès Microscopie - Congrès ram Systèmes à balayage - Congrès ram Scanning electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
subject_GND | (DE-588)4014327-2 (DE-588)4048455-5 (DE-588)1071861417 |
title | Scanned image microscopy |
title_auth | Scanned image microscopy |
title_exact_search | Scanned image microscopy |
title_full | Scanned image microscopy ed. by Eric A. Ash |
title_fullStr | Scanned image microscopy ed. by Eric A. Ash |
title_full_unstemmed | Scanned image microscopy ed. by Eric A. Ash |
title_short | Scanned image microscopy |
title_sort | scanned image microscopy |
topic | Elektronenmicroscopie gtt Microscopes électroniques à balayage - Congrès Microscopie - Congrès ram Systèmes à balayage - Congrès ram Scanning electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
topic_facet | Elektronenmicroscopie Microscopes électroniques à balayage - Congrès Microscopie - Congrès Systèmes à balayage - Congrès Scanning electron microscopy Congresses Elektronenmikroskopie Rasterelektronenmikroskopie Konferenzschrift 1980 London Scanningmethode |
volume_link | (DE-604)BV001901157 |
work_keys_str_mv | AT asherica scannedimagemicroscopy |