Scanning electron microscopy and x-ray microanalysis: A text for biologists, materials scientists, and geologists
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Plenum Press
1981
|
| Schlagworte: | |
| Beschreibung: | Literaturverz. S. 649 - 664 |
| Beschreibung: | XIII, 673 S. zahlr. Ill. u. graph. Darst. |
| ISBN: | 030640768X |
Internformat
MARC
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| 245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |b A text for biologists, materials scientists, and geologists |c Mitarb.: Joseph I. Goldstein* |
| 264 | 1 | |a New York |b Plenum Press |c 1981 | |
| 300 | |a XIII, 673 S. |b zahlr. Ill. u. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturverz. S. 649 - 664 | ||
| 650 | 4 | |a Microscopes à rayons X | |
| 650 | 4 | |a Microscopes électroniques à balayage | |
| 650 | 4 | |a Electron Probe Microanalysis | |
| 650 | 4 | |a Microscopy, Electron, Scanning | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a X-ray microanalysis | |
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| 700 | 1 | |a Goldstein, Joseph I. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001501439 | ||
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Datensatz im Suchindex
| _version_ | 1804116743855013888 |
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| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002284608 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
| callnumber-sort | QH 3212 S3 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | RB 10177 UH 6310 |
| classification_tum | CHE 264f |
| ctrlnum | (OCoLC)7733133 (DE-599)BVBBV002284608 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Chemie Geographie |
| format | Book |
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| id | DE-604.BV002284608 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:43:22Z |
| institution | BVB |
| isbn | 030640768X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001501439 |
| oclc_num | 7733133 |
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| owner_facet | DE-91G DE-BY-TUM DE-355 DE-BY-UBR DE-19 DE-BY-UBM DE-M490 DE-11 DE-188 |
| physical | XIII, 673 S. zahlr. Ill. u. graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Plenum Press |
| record_format | marc |
| spelling | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists Mitarb.: Joseph I. Goldstein* New York Plenum Press 1981 XIII, 673 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 649 - 664 Microscopes à rayons X Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s DE-604 Rasterelektronenmikroskopie (DE-588)4048455-5 s Röntgenstrukturanalyse (DE-588)4137203-7 s Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 1\p DE-604 Goldstein, Joseph I. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists Microscopes à rayons X Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Werkstoff (DE-588)4065579-9 gnd |
| subject_GND | (DE-588)4151898-6 (DE-588)4320991-9 (DE-588)4048455-5 (DE-588)4137203-7 (DE-588)4065579-9 |
| title | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists |
| title_auth | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists |
| title_exact_search | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists |
| title_full | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists Mitarb.: Joseph I. Goldstein* |
| title_fullStr | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists Mitarb.: Joseph I. Goldstein* |
| title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis A text for biologists, materials scientists, and geologists Mitarb.: Joseph I. Goldstein* |
| title_short | Scanning electron microscopy and x-ray microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis a text for biologists materials scientists and geologists |
| title_sub | A text for biologists, materials scientists, and geologists |
| topic | Microscopes à rayons X Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Werkstoff (DE-588)4065579-9 gnd |
| topic_facet | Microscopes à rayons X Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie Röntgenstrukturanalyse Werkstoff |
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