Scanning electron microscopy: Applications to materials and device science
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London
Chapman & Hall
1968
|
| Schlagworte: | |
| Beschreibung: | XV, 368 S. |
Internformat
MARC
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| 300 | |a XV, 368 S. | ||
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Datensatz im Suchindex
| _version_ | 1804116737458700288 |
|---|---|
| any_adam_object | |
| author | Thornton, Patrick R. |
| author_facet | Thornton, Patrick R. |
| author_role | aut |
| author_sort | Thornton, Patrick R. |
| author_variant | p r t pr prt |
| building | Verbundindex |
| bvnumber | BV002279025 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.E4 |
| callnumber-search | QH212.E4 |
| callnumber-sort | QH 3212 E4 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)461294 (DE-599)BVBBV002279025 |
| dewey-full | 578/.15 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 578 - Natural history of organisms |
| dewey-raw | 578/.15 |
| dewey-search | 578/.15 |
| dewey-sort | 3578 215 |
| dewey-tens | 570 - Biology |
| discipline | Physik Biologie |
| format | Book |
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| id | DE-604.BV002279025 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:43:16Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001497484 |
| oclc_num | 461294 |
| open_access_boolean | |
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| physical | XV, 368 S. |
| publishDate | 1968 |
| publishDateSearch | 1968 |
| publishDateSort | 1968 |
| publisher | Chapman & Hall |
| record_format | marc |
| spelling | Thornton, Patrick R. Verfasser aut Scanning electron microscopy Applications to materials and device science London Chapman & Hall 1968 XV, 368 S. txt rdacontent n rdamedia nc rdacarrier Microscopy, Electron Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 |
| spellingShingle | Thornton, Patrick R. Scanning electron microscopy Applications to materials and device science Microscopy, Electron Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy Applications to materials and device science |
| title_auth | Scanning electron microscopy Applications to materials and device science |
| title_exact_search | Scanning electron microscopy Applications to materials and device science |
| title_full | Scanning electron microscopy Applications to materials and device science |
| title_fullStr | Scanning electron microscopy Applications to materials and device science |
| title_full_unstemmed | Scanning electron microscopy Applications to materials and device science |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy applications to materials and device science |
| title_sub | Applications to materials and device science |
| topic | Microscopy, Electron Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Microscopy, Electron Scanning electron microscopy Rasterelektronenmikroskopie |
| work_keys_str_mv | AT thorntonpatrickr scanningelectronmicroscopyapplicationstomaterialsanddevicescience |