Design of systems and circuits for maximum reliability or maximum production yield:
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| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | Undetermined |
| Published: |
Düsseldorf
McGraw Hill
1977
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| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XIV, 293 S. graph. Darst. |
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MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV002275117 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 890928s1977 d||| |||| 00||| und d | ||
| 035 | |a (OCoLC)630424988 | ||
| 035 | |a (DE-599)BVBBV002275117 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-91 |a DE-29T |a DE-83 | ||
| 100 | 1 | |a Becker, Peter W. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Design of systems and circuits for maximum reliability or maximum production yield |c Peter W. Becker ; Finn Jensen* |
| 264 | 1 | |a Düsseldorf |b McGraw Hill |c 1977 | |
| 300 | |a XIV, 293 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Zuverlässigkeitstheorie |0 (DE-588)4195525-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Zuverlässigkeitstheorie |0 (DE-588)4195525-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Jensen, Finn |e Verfasser |4 aut | |
| 856 | 4 | 2 | |m HEBIS Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001494456&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 940 | 1 | |q TUB-nveb | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001494456 | ||
Record in the Search Index
| _version_ | 1804116732559753216 |
|---|---|
| adam_text | 5^Pr A C
Design of
Systems and Circuits
for Maximum Reliability or
Maximum Production Yield
Nachrichtentechnisch© Bibliothek
der Techn Hochschule Darmstadt
Inv -Nr » ^ ^
Peter W Becker
Electronics Laboratory
Technical University of Denmark
Finn Jensen
Consultant
Pilealle 11, DK-2840 Holte, Denmark
McGraw-Hill Book Company
New York St Louis San Francisco Auckland Bogota Düsseldorf
Johannesburg London Madrid Mexico Montreal New Delhi Panama
Paris Sao Paulo Singapore Sydney Tokyo Toronto
CONTENTS
Preface xi
List of Symbols xiii
1 Introduction 1
1-1 Point of View 1
1-2 Overview 2
1- 3 Survey of Previous Work 3
2 Some Basic Reliability Concepts S
2- 1 Some Important Kinds of Failure 6
2-2 The Reliability Function R(t) 11
2-3 Two Properties of the Reliability Function 16
2-4 Four Reliability Expressions 20
2-5 Catastrophic-failure Models 23
2-6 Combinatorial Reliability 31
2-7 System Reliability as a Function of Time 44
2-8 A Note on the Effects of Repair 64
2- 9 Graph Theory Applied to Reliability Analysis 65
3 Mathematical Design 69
3- 1 The Preliminary Design 70
3-2 The Concept of a System 71
3-3 Statement of the Design Problem in Mathematical Terms 75
vii
VÜi CONTENTS
4 A Mathematical Model of Yield or of Drift Reliability Rd(t)
4-1 A Mathematical Model for the Computation of Yield or of Drift
Reliability 83
4-2 Three Factors which Complicate the Computation of Rä(t) 88
4-3 An Example Illustrating the Effects of Statistical Dependence Among the
n Input Variables 89
4- 4 Multivariate Density Functions With Specified Marginals 96
5 Methods for Computing the Probability of System or Circuit
Success
5- 1 Classification of Circuits According to Complexity from the Viewpoint of
Probability Calculations 103
5-2 The Normal Approximation 104
5-3 The Convolution Method 108
5-4 The Method of Direct Mapping 118
5- 5 The Monte Carlo Method 130
6 Basis for the Prediction of Yield and Drift Reliability
6- 1 Information on the Probability Densities of Component Parameters 152
6- 2 The Uncertainty Associated with a Probability Density Function 159
7 Examples of Output-Variable Probability Densities Obtained by
Convolution and Monte Carlo Techniques
7- 1 The One-transistor Amplifier 163
7-2 The Three-transistor Amplifier 167
7-3 Visual Inspection of the Histograms 167
7-4 The Kolmogorov-Smirnov Two-sample Two-tailed Test 172
7- 5 The Kolmogorov-Smirnov One-sample Test 174
8 Optimization Techniques
8- 1 Statement of the Optimization Problem 176
8-2 A Review of Possible Optimization Techniques 178
8- 3 Comments on the Shape of the Response Surface 186
9 Circuit Examples Illustrating the Use of the Proposed
Design Strategies
9- 1 Search for a Feasible Solution 193
9-2 Maximization of Yield 204
9-3 General Comments on the Yield Optimization 209
Appendixes
I Amplifier Examples and Circuit Models for Transistors 211
II On Dynamic Programming and Reliability Theory 215
III Input Data for the Circuit Examples of Chapter 7 221
CONTENTS IX
IV MIL-HDBK-217 B 223
V Some Useful Reliability Definitions 226
VI A Systematic Procedure for the Generation of Cost-minimized Designs 230
VII On the Evaluation of Multiple Integrals 243
Problems 247
Solutions 257
Bibliography 281
|
| any_adam_object | 1 |
| author | Becker, Peter W. Jensen, Finn |
| author_facet | Becker, Peter W. Jensen, Finn |
| author_role | aut aut |
| author_sort | Becker, Peter W. |
| author_variant | p w b pw pwb f j fj |
| building | Verbundindex |
| bvnumber | BV002275117 |
| ctrlnum | (OCoLC)630424988 (DE-599)BVBBV002275117 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01222nam a2200313 c 4500</leader><controlfield tag="001">BV002275117</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1977 d||| |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)630424988</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002275117</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Becker, Peter W.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Design of systems and circuits for maximum reliability or maximum production yield</subfield><subfield code="c">Peter W. Becker ; Finn Jensen*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Düsseldorf</subfield><subfield code="b">McGraw Hill</subfield><subfield code="c">1977</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV, 293 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeitstheorie</subfield><subfield code="0">(DE-588)4195525-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zuverlässigkeitstheorie</subfield><subfield code="0">(DE-588)4195525-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Jensen, Finn</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HEBIS Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001494456&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nveb</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001494456</subfield></datafield></record></collection> |
| id | DE-604.BV002275117 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:43:11Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001494456 |
| oclc_num | 630424988 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-83 |
| physical | XIV, 293 S. graph. Darst. |
| psigel | TUB-nveb |
| publishDate | 1977 |
| publishDateSearch | 1977 |
| publishDateSort | 1977 |
| publisher | McGraw Hill |
| record_format | marc |
| spelling | Becker, Peter W. Verfasser aut Design of systems and circuits for maximum reliability or maximum production yield Peter W. Becker ; Finn Jensen* Düsseldorf McGraw Hill 1977 XIV, 293 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Zuverlässigkeitstheorie (DE-588)4195525-0 gnd rswk-swf Zuverlässigkeitstheorie (DE-588)4195525-0 s DE-604 Jensen, Finn Verfasser aut HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001494456&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Becker, Peter W. Jensen, Finn Design of systems and circuits for maximum reliability or maximum production yield Zuverlässigkeitstheorie (DE-588)4195525-0 gnd |
| subject_GND | (DE-588)4195525-0 |
| title | Design of systems and circuits for maximum reliability or maximum production yield |
| title_auth | Design of systems and circuits for maximum reliability or maximum production yield |
| title_exact_search | Design of systems and circuits for maximum reliability or maximum production yield |
| title_full | Design of systems and circuits for maximum reliability or maximum production yield Peter W. Becker ; Finn Jensen* |
| title_fullStr | Design of systems and circuits for maximum reliability or maximum production yield Peter W. Becker ; Finn Jensen* |
| title_full_unstemmed | Design of systems and circuits for maximum reliability or maximum production yield Peter W. Becker ; Finn Jensen* |
| title_short | Design of systems and circuits for maximum reliability or maximum production yield |
| title_sort | design of systems and circuits for maximum reliability or maximum production yield |
| topic | Zuverlässigkeitstheorie (DE-588)4195525-0 gnd |
| topic_facet | Zuverlässigkeitstheorie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001494456&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT beckerpeterw designofsystemsandcircuitsformaximumreliabilityormaximumproductionyield AT jensenfinn designofsystemsandcircuitsformaximumreliabilityormaximumproductionyield |