Electron beam x-ray microanalysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York
van Nostrand
1981
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXIII, 578 S. Ill., graph. Darst. |
| ISBN: | 0442232861 |
Internformat
MARC
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| 001 | BV002265476 | ||
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| 100 | 1 | |a Heinrich, Kurt F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron beam x-ray microanalysis |
| 264 | 1 | |a New York |b van Nostrand |c 1981 | |
| 300 | |a XXIII, 578 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electron probe microanalysis | |
| 650 | 4 | |a X-ray spectroscopy | |
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Datensatz im Suchindex
| _version_ | 1804116723177095168 |
|---|---|
| adam_text | Contents
Preface v i i
List of Symbols xv
1. Introduction 1
PART I. THE INSTRUMENT 3
2. A Summary Description of the Events in an Electron Probe
Microanalyzer 5
3. Probe-Forming Optics 14
3.1 The vacuum 14
3.2 Electron optics 18
3.2.1 the magnetic lens 23
3.2.2 the electron source 30
3.2.3 electron-optical column and alignment 38
3.3 The target assembly 44
3.3.1 the optical light microscope 47
3.3.2 the specimen stage 51
PART II. XRAY PHYSICS 57
4. The Physics of X-Rays 59
4.1 The discovery and nature of X-rays 59
4.2 X-ray emission spectra 60
: Contents
4.2.1 Moseley slaw 66
4.2.2 chemical effects on X-ray lines 69
4.2.3 X-ray line intensities 69
4.2.4 the fluorescence yield 71
4.2.5 relative transition probability 75
4.3 The absorption of X-rays 78
4.4 The diffraction of X-rays 89
PART III. THE MEASUREMENT OF X-RAYS 97
5. X-Ray Spectrometry 99
5.1 Crystal spectrometers 99
5.2 Ross filters and total reflection 113
5.3 X-ray detectors 113
5.3.1 gas-filled detectors 114
5.3.2 the lithium-drifted silicon detector 121
5.3.3 amplification and pulse height analysis 124
5.3.4 output 135
5.3.5 detector efficiency 135
5.3.6 detector resolution 138
5.3.7 detector artifacts 140
6. Measurement of the Intensity of X-Ray Emission 154
6.1 Scales of intensity of X-ray emission 154
6.2 Statistics of the measurement of count rates 156
6.3 The generation of continuous X-rays 157
6.4 Line and background 161
6.5 The recording of variable count rates 167
6.6 Drift 180
7. Qualitative Analysis 187
7.1 Element identification by means of wavelength-dispersive spectra 187
7.2 Qualitative analysis by energy dispersion 191
7.3 The limit of detection 193
7.4 Ancillary techniques 200
Contents xi
PART IV. QUANTITATIVE ANALYSIS 203
8. The Empirical Approach to Quantitation 205
8.1 The calibration function 205
8.2 The hyperbolic approximation 208
9. Theory of Quantitative Electron Probe Microanalysis:
Primary Emission 219
9.1 Introduction 219
9.2 The generation of characteristic primary X-rays 224
9.2.1 stopping power 226
9.2.2 mean excitation energy 229
9.2.3 ionization cross section 232
9.2.4 probability of ionization per incident electron 235
9.3 The backscattering of electrons 214
9.3.1 the backscatter correction factor R 241
10. The Absorption of Primary X-Rays 255
10.1 The absorption factor, fp, and the distribution in depth, #(z) 257
10.2 The experimental determination of the depth distribution of X-ray
emission 260
10.2.1 the tracer method 261
10.2.2 the variable emergence-angle method for the determination of the
absorption factor 266
10.3 Generalized models for primary absorption 271
10.3.1 Philibert s absorption model 271
10.3.2 the effect of the critical excitation potential on the primary X-ray
attenuation 278
10.3.3 empirical treatment of the absorption function 280
10.3.4 analytical expressions for the depth distribution function 0(z) 288
10.4 Distribution in depth of the continuous radiation 297
10.5 Analysis with inclined electron beam 298
xii Contents
11. Secondary X-Ray Emission 303
11.1 Fluorescence excited by characteristic lines 303
11.1.1 spatial distribution of fluorescent radiation 317
11.1.2 significance of the terms of the fluorescence equation 318
11.1.3 approximate solutions to fluorescence excitation 324
11.2 Fluorescence excited by the continuum 328
11.3 Experimental investigation of secondary emission 336
12. The Practice of Quantitative Electron Probe Microanalysis 339
12.1 The iteration procedure 339
12.1.1 variations in the iteration scheme 347
12.2 Standards 350
123 The accuracy of quantitative electron probe microanalysis 355
12.3.1 propagation of errors 359
12.3.2 sources of errors 361
12.3.3 the accuracy of the empirical method 363
12.3.4 the accuracy of the theoretical correction method 365
12.4 The determination of elements of low atomic number 375
12.5 Computer programs for electron probe quantitation 380
12.6 Quantitation with the silicon detector 390
12.7 A program for energy-dispersive quantitation 393
12.8 Applications of quantitative analysis 405
PARTV. SPATIAL ASPECTS OF ELECTRON-PROBE
MICROANALYSIS 415
13. Spatial Distribution of X-Ray Generation 417
13.1 Diffusion of electrons within the target 418
13.1.1 depth range of X-ray generation 418
13.1.2 lateral distribution of X-ray generation 422
13.2 The width of the electron beam 424
13.3 Determination of thickness and composition of thin layers 430
Contents xiii
13.4 The analysis of biological tissue 444
13.4.1 the analysis of biological fluids 448
13.4.2 indirect electron probe microanalysis 449
13.4.3 applications of electron-probe microanalysis to biological
problems 449
13.5 The analysis of small particles 450
13.6 Statistical models of electron-target interaction
(Monte Carlo method) 455
14. Scanning Electron Microscopy 467
14.1 The scanning electron microscope 467
14.2 Scanning images 471
14.3 Signals for scanning electron microscopy 477
14.3.1 secondary electrons 477
14.3.2 backscattered electrons 483
14.3.3 specimen current 491
14.3.4 cathodoluminescence 494
14.4 Artifacts and signal transforms 498
14.5 The interpretation of images of three-dimensional objects 504
15. Scanning Electron Probe Microanalysis 515
15.1 Resolution and scanning dimensions 518
15.1.1 Scans of three-dimensional objects 524
15.2 Statistical limitations of X-ray area scanning 525
15.3 Standard pulse-recording scan 529
15.4 The use of ratemeter signals for area scans 533
15.5 Digital matrix techniques 538
15.6 Multiple exposure images 539
15.6.1 multiple area scans in colors 542
xiv Contents
PART VI. THE TARGET 547
16. Target Characteristics 549
16.1 Specimen preparation 549
16.2 Electrostatic charging 551
16.3 Damage to the specimen 553
16.4 The preparation of biological tissue 555
Appendix: Statistics 557
Name Index 565
Subject Index 571
|
| any_adam_object | 1 |
| author | Heinrich, Kurt F. |
| author_facet | Heinrich, Kurt F. |
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| author_sort | Heinrich, Kurt F. |
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| callnumber-sort | QD 298 E4 |
| callnumber-subject | QD - Chemistry |
| classification_rvk | UH 6300 UQ 5600 |
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| ctrlnum | (OCoLC)6043433 (DE-599)BVBBV002265476 |
| dewey-full | 543/.0812 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.0812 |
| dewey-search | 543/.0812 |
| dewey-sort | 3543 3812 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik Chemie |
| format | Book |
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| id | DE-604.BV002265476 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:43:02Z |
| institution | BVB |
| isbn | 0442232861 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001488729 |
| oclc_num | 6043433 |
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| physical | XXIII, 578 S. Ill., graph. Darst. |
| psigel | TUB-nveb |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | van Nostrand |
| record_format | marc |
| spelling | Heinrich, Kurt F. Verfasser aut Electron beam x-ray microanalysis New York van Nostrand 1981 XXIII, 578 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electron probe microanalysis X-ray spectroscopy Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf Röntgenstrahlung (DE-588)4129728-3 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Röntgenspektroskopie (DE-588)4050331-8 s Elektronenoptik (DE-588)4151879-2 s DE-604 Röntgenstrahlung (DE-588)4129728-3 s Mikroanalyse (DE-588)4169804-6 s HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001488729&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Heinrich, Kurt F. Electron beam x-ray microanalysis Electron probe microanalysis X-ray spectroscopy Mikroanalyse (DE-588)4169804-6 gnd Röntgenspektroskopie (DE-588)4050331-8 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Elektronenoptik (DE-588)4151879-2 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4050331-8 (DE-588)4129728-3 (DE-588)4151879-2 |
| title | Electron beam x-ray microanalysis |
| title_auth | Electron beam x-ray microanalysis |
| title_exact_search | Electron beam x-ray microanalysis |
| title_full | Electron beam x-ray microanalysis |
| title_fullStr | Electron beam x-ray microanalysis |
| title_full_unstemmed | Electron beam x-ray microanalysis |
| title_short | Electron beam x-ray microanalysis |
| title_sort | electron beam x ray microanalysis |
| topic | Electron probe microanalysis X-ray spectroscopy Mikroanalyse (DE-588)4169804-6 gnd Röntgenspektroskopie (DE-588)4050331-8 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Elektronenoptik (DE-588)4151879-2 gnd |
| topic_facet | Electron probe microanalysis X-ray spectroscopy Mikroanalyse Röntgenspektroskopie Röntgenstrahlung Elektronenoptik |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001488729&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT heinrichkurtf electronbeamxraymicroanalysis |