Benninghoven, A. (1979). Secondary ion mass spectrometry: SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979. Springer.
Chicago-Zitierstil (17. Ausg.)Benninghoven, Alfred. Secondary Ion Mass Spectrometry: SIMS II ; Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979. Berlin [u.a.]: Springer, 1979.
MLA-Zitierstil (9. Ausg.)Benninghoven, Alfred. Secondary Ion Mass Spectrometry: SIMS II ; Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979. Springer, 1979.