Secondary ion mass spectrometry: SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1979
|
| Schriftenreihe: | Springer series in chemical physics
9 |
| Schlagworte: | |
| Beschreibung: | XIII, 269 S. Ill., graph. Darst. |
| ISBN: | 3540098437 0387098437 |
Internformat
MARC
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| 300 | |a XIII, 269 S. |b Ill., graph. Darst. | ||
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| 490 | 1 | |a Springer series in chemical physics |v 9 | |
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| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1979 |z Stanford Calif. |2 gnd-content | |
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Datensatz im Suchindex
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| author2 | Benninghoven, Alfred |
| author2_role | edt |
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| building | Verbundindex |
| bvnumber | BV002223640 |
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| discipline | Chemie |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1979 Stanford Calif. gnd-content |
| genre_facet | Konferenzschrift 1979 Stanford Calif. |
| id | DE-604.BV002223640 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:20Z |
| institution | BVB |
| institution_GND | (DE-588)2885-X (DE-588)2061206-0 |
| isbn | 3540098437 0387098437 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001461139 |
| oclc_num | 644312652 |
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| physical | XIII, 269 S. Ill., graph. Darst. |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 ed. A. Benninghoven ... Berlin [u.a.] Springer 1979 XIII, 269 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 9 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1979 Stanford Calif. gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Benninghoven, Alfred edt Stanford University Sonstige (DE-588)2885-X oth SIMS 2 1979 Stanford, Calif. Sonstige (DE-588)2061206-0 oth Springer series in chemical physics 9 (DE-604)BV000000670 9 |
| spellingShingle | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 Springer series in chemical physics Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 |
| title_auth | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 |
| title_exact_search | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 |
| title_full | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 ed. A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 ed. A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 ed. A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry sims ii proceedings of the second international conference on secondary ion mass spectrometry sims ii stanford university stanford california usa august 27 31 1979 |
| title_sub | SIMS II ; proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27 - 31, 1979 |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift 1979 Stanford Calif. |
| volume_link | (DE-604)BV000000670 |
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