Röntgenographische Strukturbestimmung mit dem Picker-Einkristall-Diffraktometer bei tiefen Temperaturen:
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Bibliographic Details
Main Author: Schulz, Friedrich W. (Author)
Format: Thesis Book
Language:German
Published: 1979
Subjects:
Physical Description:75 S. Ill.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!