New frontiers in testing: International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Washington, DC
Comp. Soc. Pr. of the IEEE
1988
|
| Subjects: | |
| Item Description: | Literaturangaben |
| Physical Description: | XXX, 1005 S. zahlr. graph. Darst. |
| ISBN: | 0818608706 0818648708 081868870X |
Staff View
MARC
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Record in the Search Index
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| classification_rvk | SS 1988 |
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| ctrlnum | (OCoLC)18579396 (DE-599)BVBBV002218778 |
| dewey-full | 621.395 |
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| dewey-search | 621.395 |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift 1988 Washington DC |
| id | DE-604.BV002218778 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T13:22:18Z |
| institution | BVB |
| institution_GND | (DE-588)5003007-3 |
| isbn | 0818608706 0818648708 081868870X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001457265 |
| oclc_num | 18579396 |
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| physical | XXX, 1005 S. zahlr. graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Comp. Soc. Pr. of the IEEE |
| record_format | marc |
| spelling | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC Washington, DC Comp. Soc. Pr. of the IEEE 1988 XXX, 1005 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Washington DC gnd-content Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s DE-604 International Test Conference 1988 Washington, DC Sonstige (DE-588)5003007-3 oth |
| spellingShingle | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4014346-6 (DE-588)1071861417 |
| title | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_auth | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_exact_search | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_full | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_fullStr | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_full_unstemmed | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_short | New frontiers in testing |
| title_sort | new frontiers in testing international test conference 1988 proceedings september 12 13 14 1988 sheraton washington hotel washington dc |
| title_sub | International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| topic | BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | BIST autotest génération test microprocesseur mémoire vive norme poste travail processeur VLSI simulation panne simulation test VLSI test circuit test logiciel test testabilité Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen Elektronik Konferenzschrift 1988 Washington DC |
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