New frontiers in testing: International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Washington, DC
Comp. Soc. Pr. of the IEEE
1988
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XXX, 1005 S. zahlr. graph. Darst. |
| ISBN: | 0818608706 0818648708 081868870X |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV002218778 | ||
| 003 | DE-604 | ||
| 005 | 20020912 | ||
| 007 | t| | ||
| 008 | 890928s1988 xx d||| |||| 10||| eng d | ||
| 020 | |a 0818608706 |9 0-8186-0870-6 | ||
| 020 | |a 0818648708 |9 0-8186-4870-8 | ||
| 020 | |a 081868870X |9 0-8186-8870-X | ||
| 035 | |a (OCoLC)18579396 | ||
| 035 | |a (DE-599)BVBBV002218778 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-91G |a DE-739 |a DE-29T | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.395 |2 19 | |
| 084 | |a ELT 468f |2 stub | ||
| 084 | |a ELT 359f |2 stub | ||
| 245 | 1 | 0 | |a New frontiers in testing |b International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |c ITC |
| 264 | 1 | |a Washington, DC |b Comp. Soc. Pr. of the IEEE |c 1988 | |
| 300 | |a XXX, 1005 S. |b zahlr. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 7 | |a BIST |2 inriac | |
| 650 | 7 | |a autotest |2 inriac | |
| 650 | 7 | |a génération test |2 inriac | |
| 650 | 7 | |a microprocesseur |2 inriac | |
| 650 | 7 | |a mémoire vive |2 inriac | |
| 650 | 7 | |a norme |2 inriac | |
| 650 | 7 | |a poste travail |2 inriac | |
| 650 | 7 | |a processeur VLSI |2 inriac | |
| 650 | 7 | |a simulation panne |2 inriac | |
| 650 | 7 | |a simulation |2 inriac | |
| 650 | 7 | |a test VLSI |2 inriac | |
| 650 | 7 | |a test circuit |2 inriac | |
| 650 | 7 | |a test logiciel |2 inriac | |
| 650 | 7 | |a test |2 inriac | |
| 650 | 7 | |a testabilité |2 inriac | |
| 650 | 4 | |a Automatic test equipment |v Congresses | |
| 650 | 4 | |a Electronic digital computers |x Circuits |x Testing |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1988 |z Washington DC |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 1 | |5 DE-604 | |
| 711 | 2 | |a International Test Conference |d 1988 |c Washington, DC |j Sonstige |0 (DE-588)5003007-3 |4 oth | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-001457265 | |
Datensatz im Suchindex
| _version_ | 1820868307264208896 |
|---|---|
| adam_text | |
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002218778 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | SS 1988 |
| classification_tum | ELT 468f ELT 359f |
| ctrlnum | (OCoLC)18579396 (DE-599)BVBBV002218778 |
| dewey-full | 621.395 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.395 |
| dewey-search | 621.395 |
| dewey-sort | 3621.395 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV002218778</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020912</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">890928s1988 xx d||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818608706</subfield><subfield code="9">0-8186-0870-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818648708</subfield><subfield code="9">0-8186-4870-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">081868870X</subfield><subfield code="9">0-8186-8870-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)18579396</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002218778</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.395</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 468f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">New frontiers in testing</subfield><subfield code="b">International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC</subfield><subfield code="c">ITC</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, DC</subfield><subfield code="b">Comp. Soc. Pr. of the IEEE</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXX, 1005 S.</subfield><subfield code="b">zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">BIST</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">autotest</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">génération test</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">microprocesseur</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">mémoire vive</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">norme</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">poste travail</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">processeur VLSI</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">simulation panne</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">simulation</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test VLSI</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test circuit</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test logiciel</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">test</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">testabilité</subfield><subfield code="2">inriac</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic test equipment</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic digital computers</subfield><subfield code="x">Circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1988</subfield><subfield code="z">Washington DC</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="d">1988</subfield><subfield code="c">Washington, DC</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5003007-3</subfield><subfield code="4">oth</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001457265</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1988 Washington DC gnd-content |
| genre_facet | Konferenzschrift 1988 Washington DC |
| id | DE-604.BV002218778 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T13:22:18Z |
| institution | BVB |
| institution_GND | (DE-588)5003007-3 |
| isbn | 0818608706 0818648708 081868870X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001457265 |
| oclc_num | 18579396 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-739 DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-739 DE-29T |
| physical | XXX, 1005 S. zahlr. graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Comp. Soc. Pr. of the IEEE |
| record_format | marc |
| spelling | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC Washington, DC Comp. Soc. Pr. of the IEEE 1988 XXX, 1005 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Washington DC gnd-content Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s DE-604 International Test Conference 1988 Washington, DC Sonstige (DE-588)5003007-3 oth |
| spellingShingle | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4014346-6 (DE-588)1071861417 |
| title | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_auth | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_exact_search | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| title_full | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_fullStr | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_full_unstemmed | New frontiers in testing International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC ITC |
| title_short | New frontiers in testing |
| title_sort | new frontiers in testing international test conference 1988 proceedings september 12 13 14 1988 sheraton washington hotel washington dc |
| title_sub | International Test Conference 1988 proceedings ; September 12, 13, 14, 1988 Sheraton Washington Hotel Washington, DC |
| topic | BIST inriac autotest inriac génération test inriac microprocesseur inriac mémoire vive inriac norme inriac poste travail inriac processeur VLSI inriac simulation panne inriac simulation inriac test VLSI inriac test circuit inriac test logiciel inriac test inriac testabilité inriac Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen (DE-588)4367264-4 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | BIST autotest génération test microprocesseur mémoire vive norme poste travail processeur VLSI simulation panne simulation test VLSI test circuit test logiciel test testabilité Automatic test equipment Congresses Electronic digital computers Circuits Testing Congresses Integrated circuits Testing Congresses Testen Elektronik Konferenzschrift 1988 Washington DC |
| work_keys_str_mv | AT internationaltestconferencewashingtondc newfrontiersintestinginternationaltestconference1988proceedingsseptember1213141988sheratonwashingtonhotelwashingtondc |