Automated inspection and measurement: 28 - 30 Oct. 1986 Cambridge, Mass.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1987
|
| Schriftenreihe: | Society of Photo-optical Instrumentation Engineers: Proceedings of ... .
730. |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | VI, 256 S. Ill., graph. Darst. |
| ISBN: | 089252765X |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV002214193 | ||
| 003 | DE-604 | ||
| 005 | 20060314 | ||
| 007 | t | ||
| 008 | 890928s1987 ad|| |||| 10||| eng d | ||
| 020 | |a 089252765X |9 0-89252-765-X | ||
| 035 | |a (OCoLC)15973263 | ||
| 035 | |a (DE-599)BVBBV002214193 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 050 | 0 | |a TS156.2 | |
| 082 | 0 | |a 681/.2 |2 19 | |
| 084 | |a MSR 080f |2 stub | ||
| 245 | 1 | 0 | |a Automated inspection and measurement |b 28 - 30 Oct. 1986 Cambridge, Mass. |c Michael J. W. Chen ... eds. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1987 | |
| 300 | |a VI, 256 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Society of Photo-optical Instrumentation Engineers: Proceedings of ... . |v 730. | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Mesures optiques - Congrès | |
| 650 | 4 | |a Qualité - Contrôle - Méthodes optiques - Congrès | |
| 650 | 4 | |a Engineering inspection |x Automation |v Congresses | |
| 650 | 4 | |a Quality control |x Optical methods |v Congresses | |
| 650 | 0 | 7 | |a Automatische Messung |0 (DE-588)4303176-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Messtechnik |0 (DE-588)4114575-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüfautomat |0 (DE-588)4176085-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Automation |0 (DE-588)4003957-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1986 |z Cambridge Mass. |2 gnd-content | |
| 689 | 0 | 0 | |a Automatische Messung |0 (DE-588)4303176-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Automatisches Prüfen |0 (DE-588)4269925-3 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Prüfautomat |0 (DE-588)4176085-2 |D s |
| 689 | 2 | |8 1\p |5 DE-604 | |
| 689 | 3 | 0 | |a Automation |0 (DE-588)4003957-2 |D s |
| 689 | 3 | |8 2\p |5 DE-604 | |
| 689 | 4 | 0 | |a Messtechnik |0 (DE-588)4114575-6 |D s |
| 689 | 4 | |8 3\p |5 DE-604 | |
| 700 | 1 | |a Chen, Michael J. |e Sonstige |4 oth | |
| 830 | 0 | |a Society of Photo-optical Instrumentation Engineers: Proceedings of ... . |v 730. |w (DE-604)BV000010887 |9 730. | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001454321 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804116668651143168 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002214193 |
| callnumber-first | T - Technology |
| callnumber-label | TS156 |
| callnumber-raw | TS156.2 |
| callnumber-search | TS156.2 |
| callnumber-sort | TS 3156.2 |
| callnumber-subject | TS - Manufactures |
| classification_tum | MSR 080f |
| ctrlnum | (OCoLC)15973263 (DE-599)BVBBV002214193 |
| dewey-full | 681/.2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 681 - Precision instruments and other devices |
| dewey-raw | 681/.2 |
| dewey-search | 681/.2 |
| dewey-sort | 3681 12 |
| dewey-tens | 680 - Manufacture of products for specific uses |
| discipline | Handwerk und Gewerbe / Verschiedene Technologien Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02404nam a2200601 cb4500</leader><controlfield tag="001">BV002214193</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060314 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1987 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">089252765X</subfield><subfield code="9">0-89252-765-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)15973263</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002214193</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TS156.2</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681/.2</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MSR 080f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Automated inspection and measurement</subfield><subfield code="b">28 - 30 Oct. 1986 Cambridge, Mass.</subfield><subfield code="c">Michael J. W. Chen ... eds.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 256 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Society of Photo-optical Instrumentation Engineers: Proceedings of ... .</subfield><subfield code="v">730.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mesures optiques - Congrès</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Qualité - Contrôle - Méthodes optiques - Congrès</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering inspection</subfield><subfield code="x">Automation</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield><subfield code="x">Optical methods</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Automatische Messung</subfield><subfield code="0">(DE-588)4303176-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüfautomat</subfield><subfield code="0">(DE-588)4176085-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Automatisches Prüfen</subfield><subfield code="0">(DE-588)4269925-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Automation</subfield><subfield code="0">(DE-588)4003957-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1986</subfield><subfield code="z">Cambridge Mass.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Automatische Messung</subfield><subfield code="0">(DE-588)4303176-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Automatisches Prüfen</subfield><subfield code="0">(DE-588)4269925-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Prüfautomat</subfield><subfield code="0">(DE-588)4176085-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Automation</subfield><subfield code="0">(DE-588)4003957-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Michael J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Society of Photo-optical Instrumentation Engineers: Proceedings of ... .</subfield><subfield code="v">730.</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">730.</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001454321</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1986 Cambridge Mass. gnd-content |
| genre_facet | Konferenzschrift 1986 Cambridge Mass. |
| id | DE-604.BV002214193 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:10Z |
| institution | BVB |
| isbn | 089252765X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001454321 |
| oclc_num | 15973263 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | VI, 256 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | SPIE |
| record_format | marc |
| series | Society of Photo-optical Instrumentation Engineers: Proceedings of ... . |
| series2 | Society of Photo-optical Instrumentation Engineers: Proceedings of ... . |
| spelling | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. Michael J. W. Chen ... eds. Bellingham, Wash. SPIE 1987 VI, 256 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-optical Instrumentation Engineers: Proceedings of ... . 730. Literaturangaben Mesures optiques - Congrès Qualité - Contrôle - Méthodes optiques - Congrès Engineering inspection Automation Congresses Quality control Optical methods Congresses Automatische Messung (DE-588)4303176-6 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Prüfautomat (DE-588)4176085-2 gnd rswk-swf Automatisches Prüfen (DE-588)4269925-3 gnd rswk-swf Automation (DE-588)4003957-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1986 Cambridge Mass. gnd-content Automatische Messung (DE-588)4303176-6 s DE-604 Automatisches Prüfen (DE-588)4269925-3 s Prüfautomat (DE-588)4176085-2 s 1\p DE-604 Automation (DE-588)4003957-2 s 2\p DE-604 Messtechnik (DE-588)4114575-6 s 3\p DE-604 Chen, Michael J. Sonstige oth Society of Photo-optical Instrumentation Engineers: Proceedings of ... . 730. (DE-604)BV000010887 730. 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. Society of Photo-optical Instrumentation Engineers: Proceedings of ... . Mesures optiques - Congrès Qualité - Contrôle - Méthodes optiques - Congrès Engineering inspection Automation Congresses Quality control Optical methods Congresses Automatische Messung (DE-588)4303176-6 gnd Messtechnik (DE-588)4114575-6 gnd Prüfautomat (DE-588)4176085-2 gnd Automatisches Prüfen (DE-588)4269925-3 gnd Automation (DE-588)4003957-2 gnd |
| subject_GND | (DE-588)4303176-6 (DE-588)4114575-6 (DE-588)4176085-2 (DE-588)4269925-3 (DE-588)4003957-2 (DE-588)1071861417 |
| title | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. |
| title_auth | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. |
| title_exact_search | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. |
| title_full | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. Michael J. W. Chen ... eds. |
| title_fullStr | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. Michael J. W. Chen ... eds. |
| title_full_unstemmed | Automated inspection and measurement 28 - 30 Oct. 1986 Cambridge, Mass. Michael J. W. Chen ... eds. |
| title_short | Automated inspection and measurement |
| title_sort | automated inspection and measurement 28 30 oct 1986 cambridge mass |
| title_sub | 28 - 30 Oct. 1986 Cambridge, Mass. |
| topic | Mesures optiques - Congrès Qualité - Contrôle - Méthodes optiques - Congrès Engineering inspection Automation Congresses Quality control Optical methods Congresses Automatische Messung (DE-588)4303176-6 gnd Messtechnik (DE-588)4114575-6 gnd Prüfautomat (DE-588)4176085-2 gnd Automatisches Prüfen (DE-588)4269925-3 gnd Automation (DE-588)4003957-2 gnd |
| topic_facet | Mesures optiques - Congrès Qualité - Contrôle - Méthodes optiques - Congrès Engineering inspection Automation Congresses Quality control Optical methods Congresses Automatische Messung Messtechnik Prüfautomat Automatisches Prüfen Automation Konferenzschrift 1986 Cambridge Mass. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT chenmichaelj automatedinspectionandmeasurement2830oct1986cambridgemass |