Developments in integrated circuit testing:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London u.a.
Acad. Pr.
1987
|
| Schriftenreihe: | Perspectives in computing.
18. |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | X, 440 S. graph. Darst. |
| ISBN: | 0124967353 |
Internformat
MARC
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| 245 | 1 | 0 | |a Developments in integrated circuit testing |c D. M. Miller, ed. |
| 264 | 1 | |a London u.a. |b Acad. Pr. |c 1987 | |
| 300 | |a X, 440 S. |b graph. Darst. | ||
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| 490 | 1 | |a Perspectives in computing. |v 18. | |
| 500 | |a Literaturangaben | ||
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| 650 | 4 | |a Integrated circuits |x Testing | |
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Datensatz im Suchindex
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| dewey-search | 621.381/5/0287 |
| dewey-sort | 3621.381 15 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV002211489 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:07Z |
| institution | BVB |
| isbn | 0124967353 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001452426 |
| oclc_num | 20828337 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-739 DE-706 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-739 DE-706 DE-83 |
| physical | X, 440 S. graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Acad. Pr. |
| record_format | marc |
| series | Perspectives in computing. |
| series2 | Perspectives in computing. |
| spelling | Developments in integrated circuit testing D. M. Miller, ed. London u.a. Acad. Pr. 1987 X, 440 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Perspectives in computing. 18. Literaturangaben Circuits intégrés numériques - Essais - Congrès Integrated circuits Testing Prüftechnik (DE-588)4047610-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s DE-604 Miller, D. Michael Sonstige oth Perspectives in computing. 18. (DE-604)BV000736883 18. |
| spellingShingle | Developments in integrated circuit testing Perspectives in computing. Circuits intégrés numériques - Essais - Congrès Integrated circuits Testing Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4027242-4 (DE-588)1071861417 |
| title | Developments in integrated circuit testing |
| title_auth | Developments in integrated circuit testing |
| title_exact_search | Developments in integrated circuit testing |
| title_full | Developments in integrated circuit testing D. M. Miller, ed. |
| title_fullStr | Developments in integrated circuit testing D. M. Miller, ed. |
| title_full_unstemmed | Developments in integrated circuit testing D. M. Miller, ed. |
| title_short | Developments in integrated circuit testing |
| title_sort | developments in integrated circuit testing |
| topic | Circuits intégrés numériques - Essais - Congrès Integrated circuits Testing Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
| topic_facet | Circuits intégrés numériques - Essais - Congrès Integrated circuits Testing Prüftechnik Integrierte Schaltung Konferenzschrift |
| volume_link | (DE-604)BV000736883 |
| work_keys_str_mv | AT millerdmichael developmentsinintegratedcircuittesting |