Integrated circuit quality and reliability:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York u.a.
Dekker
1987
|
| Schriftenreihe: | Electrical engineering and electronics.
41. |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XIII, 698 S. Ill., graph. Darst. |
| ISBN: | 0824776682 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV002209355 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 890928s1987 ad|| |||| 00||| eng d | ||
| 020 | |a 0824776682 |9 0-8247-7668-2 | ||
| 035 | |a (OCoLC)15653188 | ||
| 035 | |a (DE-599)BVBBV002209355 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-739 |a DE-83 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.381/73 |2 19 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ELT 240f |2 stub | ||
| 084 | |a ELT 340f |2 stub | ||
| 100 | 1 | |a Hnatek, Eugene Ronald |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Integrated circuit quality and reliability |
| 264 | 1 | |a New York u.a. |b Dekker |c 1987 | |
| 300 | |a XIII, 698 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Electrical engineering and electronics. |v 41. | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Integrated circuits |x Reliability | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 830 | 0 | |a Electrical engineering and electronics. |v 41. |w (DE-604)BV001899533 |9 41. | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001451291 | ||
Datensatz im Suchindex
| _version_ | 1804116663978688512 |
|---|---|
| any_adam_object | |
| author | Hnatek, Eugene Ronald |
| author_facet | Hnatek, Eugene Ronald |
| author_role | aut |
| author_sort | Hnatek, Eugene Ronald |
| author_variant | e r h er erh |
| building | Verbundindex |
| bvnumber | BV002209355 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 |
| classification_tum | ELT 240f ELT 340f |
| ctrlnum | (OCoLC)15653188 (DE-599)BVBBV002209355 |
| dewey-full | 621.381/73 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/73 |
| dewey-search | 621.381/73 |
| dewey-sort | 3621.381 273 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01390nam a2200421 cb4500</leader><controlfield tag="001">BV002209355</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1987 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0824776682</subfield><subfield code="9">0-8247-7668-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)15653188</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002209355</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381/73</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 340f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Hnatek, Eugene Ronald</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Integrated circuit quality and reliability</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York u.a.</subfield><subfield code="b">Dekker</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 698 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Electrical engineering and electronics.</subfield><subfield code="v">41.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Electrical engineering and electronics.</subfield><subfield code="v">41.</subfield><subfield code="w">(DE-604)BV001899533</subfield><subfield code="9">41.</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001451291</subfield></datafield></record></collection> |
| id | DE-604.BV002209355 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:06Z |
| institution | BVB |
| isbn | 0824776682 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001451291 |
| oclc_num | 15653188 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-739 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-739 DE-83 |
| physical | XIII, 698 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Dekker |
| record_format | marc |
| series | Electrical engineering and electronics. |
| series2 | Electrical engineering and electronics. |
| spelling | Hnatek, Eugene Ronald Verfasser aut Integrated circuit quality and reliability New York u.a. Dekker 1987 XIII, 698 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrical engineering and electronics. 41. Literaturangaben Integrated circuits Reliability Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Electrical engineering and electronics. 41. (DE-604)BV001899533 41. |
| spellingShingle | Hnatek, Eugene Ronald Integrated circuit quality and reliability Electrical engineering and electronics. Integrated circuits Reliability Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4059245-5 |
| title | Integrated circuit quality and reliability |
| title_auth | Integrated circuit quality and reliability |
| title_exact_search | Integrated circuit quality and reliability |
| title_full | Integrated circuit quality and reliability |
| title_fullStr | Integrated circuit quality and reliability |
| title_full_unstemmed | Integrated circuit quality and reliability |
| title_short | Integrated circuit quality and reliability |
| title_sort | integrated circuit quality and reliability |
| topic | Integrated circuits Reliability Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Integrated circuits Reliability Integrierte Schaltung Zuverlässigkeit |
| volume_link | (DE-604)BV001899533 |
| work_keys_str_mv | AT hnatekeugeneronald integratedcircuitqualityandreliability |