Failure mechanisms in semiconductor devices:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester u.a.
Wiley
1987
|
| Schlagworte: | |
| Beschreibung: | Literaturverz. S. 179 - 195 |
| Beschreibung: | XIII, 205 S. Ill., graph. Darst. |
| ISBN: | 0471914347 |
Internformat
MARC
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| 100 | 1 | |a Amerasekera, E. A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Failure mechanisms in semiconductor devices |c E. A. Amerasekera ; D. S. Campbell |
| 264 | 1 | |a Chichester u.a. |b Wiley |c 1987 | |
| 300 | |a XIII, 205 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturverz. S. 179 - 195 | ||
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Defekt |0 (DE-588)4202158-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
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| 689 | 1 | 1 | |a Defekt |0 (DE-588)4202158-3 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Campbell, D. S. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001451091 | ||
Datensatz im Suchindex
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| author | Amerasekera, E. A. Campbell, D. S. |
| author_facet | Amerasekera, E. A. Campbell, D. S. |
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| author_sort | Amerasekera, E. A. |
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| building | Verbundindex |
| bvnumber | BV002209074 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | PHY 686f |
| ctrlnum | (OCoLC)14718252 (DE-599)BVBBV002209074 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV002209074 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:42:05Z |
| institution | BVB |
| isbn | 0471914347 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001451091 |
| oclc_num | 14718252 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-11 |
| physical | XIII, 205 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Wiley |
| record_format | marc |
| spelling | Amerasekera, E. A. Verfasser aut Failure mechanisms in semiconductor devices E. A. Amerasekera ; D. S. Campbell Chichester u.a. Wiley 1987 XIII, 205 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 179 - 195 Semiconductors Failures Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Defekt (DE-588)4202158-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Störstelle (DE-588)4193400-3 s DE-604 Defekt (DE-588)4202158-3 s Campbell, D. S. Verfasser aut |
| spellingShingle | Amerasekera, E. A. Campbell, D. S. Failure mechanisms in semiconductor devices Semiconductors Failures Halbleiterbauelement (DE-588)4113826-0 gnd Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4202158-3 (DE-588)4193400-3 |
| title | Failure mechanisms in semiconductor devices |
| title_auth | Failure mechanisms in semiconductor devices |
| title_exact_search | Failure mechanisms in semiconductor devices |
| title_full | Failure mechanisms in semiconductor devices E. A. Amerasekera ; D. S. Campbell |
| title_fullStr | Failure mechanisms in semiconductor devices E. A. Amerasekera ; D. S. Campbell |
| title_full_unstemmed | Failure mechanisms in semiconductor devices E. A. Amerasekera ; D. S. Campbell |
| title_short | Failure mechanisms in semiconductor devices |
| title_sort | failure mechanisms in semiconductor devices |
| topic | Semiconductors Failures Halbleiterbauelement (DE-588)4113826-0 gnd Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd |
| topic_facet | Semiconductors Failures Halbleiterbauelement Defekt Störstelle |
| work_keys_str_mv | AT amerasekeraea failuremechanismsinsemiconductordevices AT campbellds failuremechanismsinsemiconductordevices |