Hendriks, M. (1985). X-ray diffraction study of polycrystalline silicon layers.
Chicago Style (17th ed.) CitationHendriks, Menso. X-ray Diffraction Study of Polycrystalline Silicon Layers. 1985.
MLA (9th ed.) CitationHendriks, Menso. X-ray Diffraction Study of Polycrystalline Silicon Layers. 1985.
Warning: These citations may not always be 100% accurate.