X-ray diffraction study of polycrystalline silicon layers:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
1985
|
| Schlagworte: | |
| Beschreibung: | Delft, Techn. Hogeschool, Diss. |
| Beschreibung: | 171, A16 S. Ill., graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1804116652197937152 |
|---|---|
| any_adam_object | |
| author | Hendriks, Menso |
| author_facet | Hendriks, Menso |
| author_role | aut |
| author_sort | Hendriks, Menso |
| author_variant | m h mh |
| building | Verbundindex |
| bvnumber | BV002196648 |
| classification_tum | PHY 606d PHY 697d |
| ctrlnum | (OCoLC)256279185 (DE-599)BVBBV002196648 |
| discipline | Physik |
| format | Book |
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| genre_facet | Hochschulschrift |
| id | DE-604.BV002196648 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:41:54Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001443125 |
| oclc_num | 256279185 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 171, A16 S. Ill., graph. Darst. |
| psigel | TUB-nveb |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| record_format | marc |
| spelling | Hendriks, Menso Verfasser aut X-ray diffraction study of polycrystalline silicon layers 1985 171, A16 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Delft, Techn. Hogeschool, Diss. Silicium (DE-588)4077445-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Röntgenbeugung (DE-588)4178306-2 gnd rswk-swf Amorpher Zustand (DE-588)4306087-0 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Dünne Schicht (DE-588)4136925-7 s Amorpher Zustand (DE-588)4306087-0 s Röntgenbeugung (DE-588)4178306-2 s DE-604 |
| spellingShingle | Hendriks, Menso X-ray diffraction study of polycrystalline silicon layers Silicium (DE-588)4077445-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Röntgenbeugung (DE-588)4178306-2 gnd Amorpher Zustand (DE-588)4306087-0 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4136925-7 (DE-588)4178306-2 (DE-588)4306087-0 (DE-588)4113937-9 |
| title | X-ray diffraction study of polycrystalline silicon layers |
| title_auth | X-ray diffraction study of polycrystalline silicon layers |
| title_exact_search | X-ray diffraction study of polycrystalline silicon layers |
| title_full | X-ray diffraction study of polycrystalline silicon layers |
| title_fullStr | X-ray diffraction study of polycrystalline silicon layers |
| title_full_unstemmed | X-ray diffraction study of polycrystalline silicon layers |
| title_short | X-ray diffraction study of polycrystalline silicon layers |
| title_sort | x ray diffraction study of polycrystalline silicon layers |
| topic | Silicium (DE-588)4077445-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Röntgenbeugung (DE-588)4178306-2 gnd Amorpher Zustand (DE-588)4306087-0 gnd |
| topic_facet | Silicium Dünne Schicht Röntgenbeugung Amorpher Zustand Hochschulschrift |
| work_keys_str_mv | AT hendriksmenso xraydiffractionstudyofpolycrystallinesiliconlayers |