In-circuit testing:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York
VanNostrand Reinhold
1985
|
Schlagworte: | |
Beschreibung: | XVII, 243 S. graph. Darst. |
ISBN: | 0442212844 |
Internformat
MARC
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035 | |a (OCoLC)11532914 | ||
035 | |a (DE-599)BVBBV002193735 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
050 | 0 | |a TK7868.P7 | |
082 | 0 | |a 621.381/74 |2 19 | |
084 | |a ELT 275f |2 stub | ||
084 | |a ELT 238f |2 stub | ||
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245 | 1 | 0 | |a In-circuit testing |
264 | 1 | |a New York |b VanNostrand Reinhold |c 1985 | |
300 | |a XVII, 243 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Printed circuits |x Testing | |
650 | 0 | 7 | |a Gedruckte Schaltung |0 (DE-588)4019627-6 |2 gnd |9 rswk-swf |
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689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001440899 |
Datensatz im Suchindex
_version_ | 1804116648889679872 |
---|---|
any_adam_object | |
author | Bateson, John |
author_facet | Bateson, John |
author_role | aut |
author_sort | Bateson, John |
author_variant | j b jb |
building | Verbundindex |
bvnumber | BV002193735 |
callnumber-first | T - Technology |
callnumber-label | TK7868 |
callnumber-raw | TK7868.P7 |
callnumber-search | TK7868.P7 |
callnumber-sort | TK 47868 P7 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_tum | ELT 275f ELT 238f |
ctrlnum | (OCoLC)11532914 (DE-599)BVBBV002193735 |
dewey-full | 621.381/74 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381/74 |
dewey-search | 621.381/74 |
dewey-sort | 3621.381 274 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV002193735 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:41:51Z |
institution | BVB |
isbn | 0442212844 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001440899 |
oclc_num | 11532914 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | XVII, 243 S. graph. Darst. |
publishDate | 1985 |
publishDateSearch | 1985 |
publishDateSort | 1985 |
publisher | VanNostrand Reinhold |
record_format | marc |
spelling | Bateson, John Verfasser aut In-circuit testing New York VanNostrand Reinhold 1985 XVII, 243 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Gedruckte Schaltung (DE-588)4019627-6 s Prüftechnik (DE-588)4047610-8 s DE-604 |
spellingShingle | Bateson, John In-circuit testing Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
subject_GND | (DE-588)4019627-6 (DE-588)4047610-8 |
title | In-circuit testing |
title_auth | In-circuit testing |
title_exact_search | In-circuit testing |
title_full | In-circuit testing |
title_fullStr | In-circuit testing |
title_full_unstemmed | In-circuit testing |
title_short | In-circuit testing |
title_sort | in circuit testing |
topic | Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
topic_facet | Printed circuits Testing Gedruckte Schaltung Prüftechnik |
work_keys_str_mv | AT batesonjohn incircuittesting |