Multiple-beam interferometry of surfaces and films:
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Bibliographic Details
Main Author: Tolansky, Samuel (Author)
Format: Book
Language:English
Published: Oxford [u.a.] Clarendon Pr. 1949
Edition:Repr.
Series:Monographs on the physics and chemistry of materials, 1
Subjects:
Physical Description:VIII, 187 S. Ill., graph. Darst.

There is no print copy available.

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