Multiple-beam interferometry of surfaces and films:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Oxford [u.a.]
Clarendon Pr.
1949
|
Ausgabe: | Repr. |
Schriftenreihe: | Monographs on the physics and chemistry of materials,
1 |
Schlagworte: | |
Beschreibung: | VIII, 187 S. Ill., graph. Darst. |
Internformat
MARC
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035 | |a (OCoLC)249847835 | ||
035 | |a (DE-599)BVBBV002185473 | ||
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041 | 0 | |a eng | |
049 | |a DE-19 |a DE-29T |a DE-83 | ||
050 | 0 | |a QC411 | |
082 | 0 | |a 535.4 |2 20 | |
084 | |a UH 5400 |0 (DE-625)145660: |2 rvk | ||
100 | 1 | |a Tolansky, Samuel |e Verfasser |4 aut | |
245 | 1 | 0 | |a Multiple-beam interferometry of surfaces and films |c by S. Tolansky |
250 | |a Repr. | ||
264 | 1 | |a Oxford [u.a.] |b Clarendon Pr. |c 1949 | |
300 | |a VIII, 187 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Monographs on the physics and chemistry of materials, |v 1 | |
650 | 4 | |a Interferometers | |
650 | 4 | |a Metallography | |
650 | 4 | |a Surfaces (Technology) | |
650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Vielstrahlinterferenz |0 (DE-588)4336384-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Oberfläche |0 (DE-588)4042907-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Oberfläche |0 (DE-588)4042907-6 |D s |
689 | 0 | 1 | |a Vielstrahlinterferenz |0 (DE-588)4336384-2 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
689 | 1 | 1 | |a Vielstrahlinterferenz |0 (DE-588)4336384-2 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
689 | 2 | |8 1\p |5 DE-604 | |
830 | 0 | |a Monographs on the physics and chemistry of materials, |v 1 |w (DE-604)BV000725086 |9 1 | |
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-001435487 |
Datensatz im Suchindex
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---|---|
adam_text | |
any_adam_object | |
author | Tolansky, Samuel |
author_facet | Tolansky, Samuel |
author_role | aut |
author_sort | Tolansky, Samuel |
author_variant | s t st |
building | Verbundindex |
bvnumber | BV002185473 |
callnumber-first | Q - Science |
callnumber-label | QC411 |
callnumber-raw | QC411 |
callnumber-search | QC411 |
callnumber-sort | QC 3411 |
callnumber-subject | QC - Physics |
classification_rvk | UH 5400 |
ctrlnum | (OCoLC)249847835 (DE-599)BVBBV002185473 |
dewey-full | 535.4 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 535 - Light and related radiation |
dewey-raw | 535.4 |
dewey-search | 535.4 |
dewey-sort | 3535.4 |
dewey-tens | 530 - Physics |
discipline | Physik |
edition | Repr. |
format | Book |
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id | DE-604.BV002185473 |
illustrated | Illustrated |
indexdate | 2024-12-06T15:14:07Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001435487 |
oclc_num | 249847835 |
open_access_boolean | |
owner | DE-19 DE-BY-UBM DE-29T DE-83 |
owner_facet | DE-19 DE-BY-UBM DE-29T DE-83 |
physical | VIII, 187 S. Ill., graph. Darst. |
publishDate | 1949 |
publishDateSearch | 1949 |
publishDateSort | 1949 |
publisher | Clarendon Pr. |
record_format | marc |
series | Monographs on the physics and chemistry of materials, |
series2 | Monographs on the physics and chemistry of materials, |
spelling | Tolansky, Samuel Verfasser aut Multiple-beam interferometry of surfaces and films by S. Tolansky Repr. Oxford [u.a.] Clarendon Pr. 1949 VIII, 187 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials, 1 Interferometers Metallography Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Vielstrahlinterferenz (DE-588)4336384-2 gnd rswk-swf Oberfläche (DE-588)4042907-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberfläche (DE-588)4042907-6 s Vielstrahlinterferenz (DE-588)4336384-2 s DE-604 Dünne Schicht (DE-588)4136925-7 s Oberflächenanalyse (DE-588)4172243-7 s 1\p DE-604 Monographs on the physics and chemistry of materials, 1 (DE-604)BV000725086 1 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Tolansky, Samuel Multiple-beam interferometry of surfaces and films Monographs on the physics and chemistry of materials, Interferometers Metallography Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd Vielstrahlinterferenz (DE-588)4336384-2 gnd Oberfläche (DE-588)4042907-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
subject_GND | (DE-588)4136925-7 (DE-588)4336384-2 (DE-588)4042907-6 (DE-588)4172243-7 |
title | Multiple-beam interferometry of surfaces and films |
title_auth | Multiple-beam interferometry of surfaces and films |
title_exact_search | Multiple-beam interferometry of surfaces and films |
title_full | Multiple-beam interferometry of surfaces and films by S. Tolansky |
title_fullStr | Multiple-beam interferometry of surfaces and films by S. Tolansky |
title_full_unstemmed | Multiple-beam interferometry of surfaces and films by S. Tolansky |
title_short | Multiple-beam interferometry of surfaces and films |
title_sort | multiple beam interferometry of surfaces and films |
topic | Interferometers Metallography Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd Vielstrahlinterferenz (DE-588)4336384-2 gnd Oberfläche (DE-588)4042907-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
topic_facet | Interferometers Metallography Surfaces (Technology) Dünne Schicht Vielstrahlinterferenz Oberfläche Oberflächenanalyse |
volume_link | (DE-604)BV000725086 |
work_keys_str_mv | AT tolanskysamuel multiplebeaminterferometryofsurfacesandfilms |