Verfügbarkeit: Experimental high-resolution electron microscopy

Experimental high-resolution electron microscopy:

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Bibliographische Detailangaben
1. Verfasser:	Spence, John C. (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Oxford Clarendon Pr. 1981
Schriftenreihe:	Monographs on the physics and chemistry of materials Oxford science publications
Schlagworte:	Electron microscopy Microscopy, Electron Elektronenbeugung Struktur Durchstrahlungselektronenmikroskopie Hochauflösendes Verfahren Elektronenmikroskopie Festkörper
Beschreibung:	XII, 370 S. graph. Darst.
ISBN:	0198513658

Internformat

MARC


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Datensatz im Suchindex

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author	Spence, John C.
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dewey-tens	500 - Natural sciences and mathematics 530 - Physics
discipline	Allgemeine Naturwissenschaft Physik Chemie
format	Book
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illustrated	Illustrated
indexdate	2024-07-09T15:41:06Z
institution	BVB
isbn	0198513658
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-001408265
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owner	DE-706 DE-188
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physical	XII, 370 S. graph. Darst.
publishDate	1981
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publisher	Clarendon Pr.
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series2	Monographs on the physics and chemistry of materials Oxford science publications
spelling	Spence, John C. Verfasser aut Experimental high-resolution electron microscopy John C. H. Spence Oxford Clarendon Pr. 1981 XII, 370 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials Oxford science publications Electron microscopy Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 Struktur (DE-588)4058125-1 s 2\p DE-604 Festkörper (DE-588)4016918-2 s 3\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 4\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Spence, John C. Experimental high-resolution electron microscopy Electron microscopy Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd
subject_GND	(DE-588)4151862-7 (DE-588)4058125-1 (DE-588)4215608-7 (DE-588)4287503-1 (DE-588)4014327-2 (DE-588)4016918-2
title	Experimental high-resolution electron microscopy
title_auth	Experimental high-resolution electron microscopy
title_exact_search	Experimental high-resolution electron microscopy
title_full	Experimental high-resolution electron microscopy John C. H. Spence
title_fullStr	Experimental high-resolution electron microscopy John C. H. Spence
title_full_unstemmed	Experimental high-resolution electron microscopy John C. H. Spence
title_short	Experimental high-resolution electron microscopy
title_sort	experimental high resolution electron microscopy
topic	Electron microscopy Microscopy, Electron Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd
topic_facet	Electron microscopy Microscopy, Electron Elektronenbeugung Struktur Durchstrahlungselektronenmikroskopie Hochauflösendes Verfahren Elektronenmikroskopie Festkörper
work_keys_str_mv	AT spencejohnc experimentalhighresolutionelectronmicroscopy

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