Introduction to VLSI testing:
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Englewood Cliffs, NJ
Prentice Hall
1988
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Schlagworte: | |
Beschreibung: | XIII, 226 S. graph. Darst. |
ISBN: | 0134988663 |
Internformat
MARC
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245 | 1 | 0 | |a Introduction to VLSI testing |c Robert J. Feugate ; Steven M. McIntyre |
264 | 1 | |a Englewood Cliffs, NJ |b Prentice Hall |c 1988 | |
300 | |a XIII, 226 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
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650 | 0 | 7 | |a MOS-Schaltung |0 (DE-588)4135571-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Transistor |0 (DE-588)4060646-6 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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any_adam_object | |
author | Feugate, Robert J. MacIntyre, Steven M. |
author_facet | Feugate, Robert J. MacIntyre, Steven M. |
author_role | aut aut |
author_sort | Feugate, Robert J. |
author_variant | r j f rj rjf s m m sm smm |
building | Verbundindex |
bvnumber | BV002134201 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ST 190 |
classification_tum | ELT 238f ELT 355f |
ctrlnum | (OCoLC)16087905 (DE-599)BVBBV002134201 |
dewey-full | 621.395 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.395 |
dewey-search | 621.395 |
dewey-sort | 3621.395 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV002134201 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:40:53Z |
institution | BVB |
isbn | 0134988663 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001399530 |
oclc_num | 16087905 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-739 DE-29T DE-83 |
owner_facet | DE-91 DE-BY-TUM DE-739 DE-29T DE-83 |
physical | XIII, 226 S. graph. Darst. |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
publisher | Prentice Hall |
record_format | marc |
spelling | Feugate, Robert J. Verfasser aut Introduction to VLSI testing Robert J. Feugate ; Steven M. McIntyre Englewood Cliffs, NJ Prentice Hall 1988 XIII, 226 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf MOS-Schaltung (DE-588)4135571-4 gnd rswk-swf Transistor (DE-588)4060646-6 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 Transistor (DE-588)4060646-6 s 1\p DE-604 MOS-Schaltung (DE-588)4135571-4 s 2\p DE-604 Integrierte Schaltung (DE-588)4027242-4 s 3\p DE-604 MacIntyre, Steven M. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Feugate, Robert J. MacIntyre, Steven M. Introduction to VLSI testing Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd Integrierte Schaltung (DE-588)4027242-4 gnd MOS-Schaltung (DE-588)4135571-4 gnd Transistor (DE-588)4060646-6 gnd |
subject_GND | (DE-588)4047610-8 (DE-588)4117388-0 (DE-588)4027242-4 (DE-588)4135571-4 (DE-588)4060646-6 |
title | Introduction to VLSI testing |
title_auth | Introduction to VLSI testing |
title_exact_search | Introduction to VLSI testing |
title_full | Introduction to VLSI testing Robert J. Feugate ; Steven M. McIntyre |
title_fullStr | Introduction to VLSI testing Robert J. Feugate ; Steven M. McIntyre |
title_full_unstemmed | Introduction to VLSI testing Robert J. Feugate ; Steven M. McIntyre |
title_short | Introduction to VLSI testing |
title_sort | introduction to vlsi testing |
topic | Integrated circuits Very large scale integration Testing Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd Integrierte Schaltung (DE-588)4027242-4 gnd MOS-Schaltung (DE-588)4135571-4 gnd Transistor (DE-588)4060646-6 gnd |
topic_facet | Integrated circuits Very large scale integration Testing Prüftechnik VLSI Integrierte Schaltung MOS-Schaltung Transistor |
work_keys_str_mv | AT feugaterobertj introductiontovlsitesting AT macintyrestevenm introductiontovlsitesting |