Microscopic identification of electronic defects in semiconductors: symposium held April 15 - 18, 1985, San Francisco, Calif., USA
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Pittsburgh, Penn.
MRS, Materials Research Soc.
1985
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings.
46. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XV, 604 S. Ill., graph. Darst. |
| ISBN: | 0931837111 |
Internformat
MARC
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| 245 | 1 | 0 | |a Microscopic identification of electronic defects in semiconductors |b symposium held April 15 - 18, 1985, San Francisco, Calif., USA |c eds.: Noble M. Johnson ... |
| 264 | 1 | |a Pittsburgh, Penn. |b MRS, Materials Research Soc. |c 1985 | |
| 300 | |a XV, 604 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings. |v 46. | |
| 500 | |a Literaturangaben | ||
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| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1985 |z San Francisco |2 gnd-content | |
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| 700 | 1 | |a Johnson, Noble M. |4 edt | |
| 711 | 2 | |a Symposium on Microscopic Identification of Electronic Defects in Semiconductors |d 1985 |c San Francisco, Calif. |j Sonstige |0 (DE-588)5026050-9 |4 oth | |
| 830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings. |v 46. |w (DE-604)BV001899105 |9 46. | |
| 856 | 4 | 2 | |u https://www.gbv.de/dms/tib-ub-hannover/040014541.pdf |3 Inhaltsverzeichnis |
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Datensatz im Suchindex
| _version_ | 1804116571956707328 |
|---|---|
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| author2 | Johnson, Noble M. |
| author2_role | edt |
| author2_variant | n m j nm nmj |
| author_facet | Johnson, Noble M. |
| building | Verbundindex |
| bvnumber | BV002118072 |
| classification_tum | PHY 621f PHY 685f |
| ctrlnum | (OCoLC)630498082 (DE-599)BVBBV002118072 |
| discipline | Physik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1985 San Francisco gnd-content |
| genre_facet | Konferenzschrift 1985 San Francisco |
| id | DE-604.BV002118072 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:40:38Z |
| institution | BVB |
| institution_GND | (DE-588)5026050-9 |
| isbn | 0931837111 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001389046 |
| oclc_num | 630498082 |
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| owner_facet | DE-91 DE-BY-TUM DE-83 DE-11 |
| physical | XV, 604 S. Ill., graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | MRS, Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings. |
| series2 | Materials Research Society: Materials Research Society symposia proceedings. |
| spelling | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA eds.: Noble M. Johnson ... Pittsburgh, Penn. MRS, Materials Research Soc. 1985 XV, 604 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings. 46. Literaturangaben Mikroskopie (DE-588)4039238-7 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1985 San Francisco gnd-content Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s Mikroskopie (DE-588)4039238-7 s DE-604 Johnson, Noble M. edt Symposium on Microscopic Identification of Electronic Defects in Semiconductors 1985 San Francisco, Calif. Sonstige (DE-588)5026050-9 oth Materials Research Society: Materials Research Society symposia proceedings. 46. (DE-604)BV001899105 46. https://www.gbv.de/dms/tib-ub-hannover/040014541.pdf Inhaltsverzeichnis |
| spellingShingle | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA Materials Research Society: Materials Research Society symposia proceedings. Mikroskopie (DE-588)4039238-7 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4039238-7 (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)1071861417 |
| title | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA |
| title_auth | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA |
| title_exact_search | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA |
| title_full | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA eds.: Noble M. Johnson ... |
| title_fullStr | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA eds.: Noble M. Johnson ... |
| title_full_unstemmed | Microscopic identification of electronic defects in semiconductors symposium held April 15 - 18, 1985, San Francisco, Calif., USA eds.: Noble M. Johnson ... |
| title_short | Microscopic identification of electronic defects in semiconductors |
| title_sort | microscopic identification of electronic defects in semiconductors symposium held april 15 18 1985 san francisco calif usa |
| title_sub | symposium held April 15 - 18, 1985, San Francisco, Calif., USA |
| topic | Mikroskopie (DE-588)4039238-7 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Mikroskopie Gitterbaufehler Halbleiter Konferenzschrift 1985 San Francisco |
| url | https://www.gbv.de/dms/tib-ub-hannover/040014541.pdf |
| volume_link | (DE-604)BV001899105 |
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