Rational fault analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Dekker
1977
|
| Schriftenreihe: | Electrical engineering and electronics.
1. |
| Schlagworte: | |
| Beschreibung: | IX, 241 S. graph. Darst. |
| ISBN: | 0824765419 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV002100422 | ||
| 003 | DE-604 | ||
| 005 | 20151016 | ||
| 007 | t | ||
| 008 | 890928s1977 d||| |||| 10||| eng d | ||
| 020 | |a 0824765419 |9 0-8247-6541-9 | ||
| 035 | |a (OCoLC)3002983 | ||
| 035 | |a (DE-599)BVBBV002100422 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 050 | 0 | |a TK7870 | |
| 082 | 0 | |a 621.3815/1/028 | |
| 245 | 1 | 0 | |a Rational fault analysis |c Ed. by Richard Saeks ... |
| 264 | 1 | |a New York [u.a.] |b Dekker |c 1977 | |
| 300 | |a IX, 241 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Electrical engineering and electronics. |v 1. | |
| 650 | 7 | |a Betrouwbaarheid |2 gtt | |
| 650 | 7 | |a Elektronica |2 gtt | |
| 650 | 7 | |a Fouten |2 gtt | |
| 650 | 7 | |a Testen |2 gtt | |
| 650 | 4 | |a Automatic test equipment |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Korrektur |0 (DE-588)4205358-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Programmierung |0 (DE-588)4076370-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Programmierung |0 (DE-588)4076370-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Korrektur |0 (DE-588)4205358-4 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Saeks, Richard |e Sonstige |4 oth | |
| 830 | 0 | |a Electrical engineering and electronics. |v 1. |w (DE-604)BV001899533 |9 1. | |
| 940 | 1 | |q TUB-nseb | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001376939 | ||
Datensatz im Suchindex
| _version_ | 1804116553664299008 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002100422 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)3002983 (DE-599)BVBBV002100422 |
| dewey-full | 621.3815/1/028 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/1/028 |
| dewey-search | 621.3815/1/028 |
| dewey-sort | 3621.3815 11 228 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01597nam a2200481 cb4500</leader><controlfield tag="001">BV002100422</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20151016 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1977 d||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0824765419</subfield><subfield code="9">0-8247-6541-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)3002983</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002100422</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/1/028</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Rational fault analysis</subfield><subfield code="c">Ed. by Richard Saeks ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Dekker</subfield><subfield code="c">1977</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 241 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Electrical engineering and electronics.</subfield><subfield code="v">1.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Betrouwbaarheid</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Elektronica</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Fouten</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Testen</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic test equipment</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Korrektur</subfield><subfield code="0">(DE-588)4205358-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Programmierung</subfield><subfield code="0">(DE-588)4076370-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Programmierung</subfield><subfield code="0">(DE-588)4076370-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Korrektur</subfield><subfield code="0">(DE-588)4205358-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Saeks, Richard</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Electrical engineering and electronics.</subfield><subfield code="v">1.</subfield><subfield code="w">(DE-604)BV001899533</subfield><subfield code="9">1.</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nseb</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001376939</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV002100422 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:40:20Z |
| institution | BVB |
| isbn | 0824765419 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001376939 |
| oclc_num | 3002983 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | IX, 241 S. graph. Darst. |
| psigel | TUB-nseb |
| publishDate | 1977 |
| publishDateSearch | 1977 |
| publishDateSort | 1977 |
| publisher | Dekker |
| record_format | marc |
| series | Electrical engineering and electronics. |
| series2 | Electrical engineering and electronics. |
| spelling | Rational fault analysis Ed. by Richard Saeks ... New York [u.a.] Dekker 1977 IX, 241 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrical engineering and electronics. 1. Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Korrektur (DE-588)4205358-4 gnd rswk-swf Programmierung (DE-588)4076370-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Programmierung (DE-588)4076370-5 s DE-604 Korrektur (DE-588)4205358-4 s Saeks, Richard Sonstige oth Electrical engineering and electronics. 1. (DE-604)BV001899533 1. |
| spellingShingle | Rational fault analysis Electrical engineering and electronics. Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Korrektur (DE-588)4205358-4 gnd Programmierung (DE-588)4076370-5 gnd |
| subject_GND | (DE-588)4205358-4 (DE-588)4076370-5 (DE-588)1071861417 |
| title | Rational fault analysis |
| title_auth | Rational fault analysis |
| title_exact_search | Rational fault analysis |
| title_full | Rational fault analysis Ed. by Richard Saeks ... |
| title_fullStr | Rational fault analysis Ed. by Richard Saeks ... |
| title_full_unstemmed | Rational fault analysis Ed. by Richard Saeks ... |
| title_short | Rational fault analysis |
| title_sort | rational fault analysis |
| topic | Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Korrektur (DE-588)4205358-4 gnd Programmierung (DE-588)4076370-5 gnd |
| topic_facet | Betrouwbaarheid Elektronica Fouten Testen Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Korrektur Programmierung Konferenzschrift |
| volume_link | (DE-604)BV001899533 |
| work_keys_str_mv | AT saeksrichard rationalfaultanalysis |