Quality, productivity, profit: digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982
Gespeichert in:
Format: | Tagungsbericht Buch |
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Sprache: | English |
Veröffentlicht: |
Silver Spring, MD
IEEE Computer Soc. Pr.
1982
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Schlagworte: | |
Beschreibung: | Literaturangaben |
Beschreibung: | XXIII, 672 S. Ill., zahlr. graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV002098317 | ||
003 | DE-604 | ||
005 | 20170522 | ||
007 | t | ||
008 | 890928s1982 ad|| |||| 10||| eng d | ||
035 | |a (OCoLC)256442403 | ||
035 | |a (DE-599)BVBBV002098317 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-11 | ||
245 | 1 | 0 | |a Quality, productivity, profit |b digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 |c Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee |
264 | 1 | |a Silver Spring, MD |b IEEE Computer Soc. Pr. |c 1982 | |
300 | |a XXIII, 672 S. |b Ill., zahlr. graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturangaben | ||
650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1982 |z Cherry Hill NY |2 gnd-content | |
689 | 0 | 0 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 0 | 1 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
689 | 0 | |5 DE-604 | |
710 | 2 | |a IEEE Computer Society |b Test Technology Committee |e Sonstige |0 (DE-588)212659-X |4 oth | |
711 | 2 | |a International Test Conference |d 1982 |c Cherry Hill, NJ |j Sonstige |0 (DE-588)5001851-6 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001375402 |
Datensatz im Suchindex
_version_ | 1804116551380500480 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV002098317 |
ctrlnum | (OCoLC)256442403 (DE-599)BVBBV002098317 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01427nam a2200337 c 4500</leader><controlfield tag="001">BV002098317</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20170522 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1982 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)256442403</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002098317</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Quality, productivity, profit</subfield><subfield code="b">digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982</subfield><subfield code="c">Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Silver Spring, MD</subfield><subfield code="b">IEEE Computer Soc. Pr.</subfield><subfield code="c">1982</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXIII, 672 S.</subfield><subfield code="b">Ill., zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1982</subfield><subfield code="z">Cherry Hill NY</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">IEEE Computer Society</subfield><subfield code="b">Test Technology Committee</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)212659-X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="d">1982</subfield><subfield code="c">Cherry Hill, NJ</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5001851-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001375402</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1982 Cherry Hill NY gnd-content |
genre_facet | Konferenzschrift 1982 Cherry Hill NY |
id | DE-604.BV002098317 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:40:18Z |
institution | BVB |
institution_GND | (DE-588)212659-X (DE-588)5001851-6 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001375402 |
oclc_num | 256442403 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-11 |
owner_facet | DE-91 DE-BY-TUM DE-11 |
physical | XXIII, 672 S. Ill., zahlr. graph. Darst. |
publishDate | 1982 |
publishDateSearch | 1982 |
publishDateSort | 1982 |
publisher | IEEE Computer Soc. Pr. |
record_format | marc |
spelling | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee Silver Spring, MD IEEE Computer Soc. Pr. 1982 XXIII, 672 S. Ill., zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1982 Cherry Hill NY gnd-content Prüftechnik (DE-588)4047610-8 s Elektronische Schaltung (DE-588)4113419-9 s DE-604 IEEE Computer Society Test Technology Committee Sonstige (DE-588)212659-X oth International Test Conference 1982 Cherry Hill, NJ Sonstige (DE-588)5001851-6 oth |
spellingShingle | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
subject_GND | (DE-588)4113419-9 (DE-588)4047610-8 (DE-588)1071861417 |
title | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 |
title_auth | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 |
title_exact_search | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 |
title_full | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee |
title_fullStr | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee |
title_full_unstemmed | Quality, productivity, profit digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 Urheber: International Test Conference <13, 1982, Cherry Hill, NY>. KR: Computer Society / Test Technology Committee |
title_short | Quality, productivity, profit |
title_sort | quality productivity profit digest of papers 1982 international test conference november 15 18 1982 |
title_sub | digest of papers ; 1982 International Test Conference ; November 15 - 18, 1982 |
topic | Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
topic_facet | Elektronische Schaltung Prüftechnik Konferenzschrift 1982 Cherry Hill NY |
work_keys_str_mv | AT ieeecomputersocietytesttechnologycommittee qualityproductivityprofitdigestofpapers1982internationaltestconferencenovember15181982 AT internationaltestconferencecherryhillnj qualityproductivityprofitdigestofpapers1982internationaltestconferencenovember15181982 |