Digital failure rate data: microcircuit device reliability
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
New York
Reliability Analysis Center
1979
|
| Beschreibung: | XII, 416 S. |
Internformat
MARC
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| 245 | 1 | 0 | |a Digital failure rate data |b microcircuit device reliability |c Bearb. von David B. Nicholls* |
| 264 | 1 | |a New York |b Reliability Analysis Center |c 1979 | |
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Datensatz im Suchindex
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| id | DE-604.BV002093732 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:40:13Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001371839 |
| oclc_num | 630291601 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | XII, 416 S. |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | Reliability Analysis Center |
| record_format | marc |
| spelling | Digital failure rate data microcircuit device reliability Bearb. von David B. Nicholls* New York Reliability Analysis Center 1979 XII, 416 S. txt rdacontent n rdamedia nc rdacarrier Nicholls, David B. Sonstige oth |
| spellingShingle | Digital failure rate data microcircuit device reliability |
| title | Digital failure rate data microcircuit device reliability |
| title_auth | Digital failure rate data microcircuit device reliability |
| title_exact_search | Digital failure rate data microcircuit device reliability |
| title_full | Digital failure rate data microcircuit device reliability Bearb. von David B. Nicholls* |
| title_fullStr | Digital failure rate data microcircuit device reliability Bearb. von David B. Nicholls* |
| title_full_unstemmed | Digital failure rate data microcircuit device reliability Bearb. von David B. Nicholls* |
| title_short | Digital failure rate data |
| title_sort | digital failure rate data microcircuit device reliability |
| title_sub | microcircuit device reliability |
| work_keys_str_mv | AT nichollsdavidb digitalfailureratedatamicrocircuitdevicereliability |