Surface characterization and testing: 21 - 22 Aug. 1986 San Diego, Calif.
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Bibliographic Details
Format: Book
Language:English
Published: Washington, USA SPIE 1987
Series:International Society for Optical Engineering: Proceedings of SPIE. 680.
Subjects:
Item Description:Literaturangaben
Physical Description:V, 174 S. Ill., graph. Darst.
ISBN:0892527153

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