Proceedings IMTC 85: IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla.
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
Piscataway, NJ
IEEE Service Center
1985
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Schlagworte: | |
Beschreibung: | Literaturangaben |
Beschreibung: | 285 S. Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV002051800 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 890928s1985 ad|| |||| 10||| und d | ||
035 | |a (OCoLC)631670604 | ||
035 | |a (DE-599)BVBBV002051800 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-91 | ||
084 | |a MSR 100f |2 stub | ||
111 | 2 | |a Instrumentation and Measurement Technology Conference |n 2 |d 1985 |c Tampa, Fla. |j Verfasser |0 (DE-588)5002886-8 |4 aut | |
245 | 1 | 0 | |a Proceedings IMTC 85 |b IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. |c Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers* |
264 | 1 | |a Piscataway, NJ |b IEEE Service Center |c 1985 | |
300 | |a 285 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturangaben | ||
650 | 0 | 7 | |a Elektrische Messtechnik |0 (DE-588)4124827-2 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1985 |z Tampa Fla. |2 gnd-content | |
689 | 0 | 0 | |a Elektrische Messtechnik |0 (DE-588)4124827-2 |D s |
689 | 0 | |5 DE-604 | |
710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001341688 |
Datensatz im Suchindex
_version_ | 1804116501777612800 |
---|---|
any_adam_object | |
author_corporate | Instrumentation and Measurement Technology Conference Tampa, Fla |
author_corporate_role | aut |
author_facet | Instrumentation and Measurement Technology Conference Tampa, Fla |
author_sort | Instrumentation and Measurement Technology Conference Tampa, Fla |
building | Verbundindex |
bvnumber | BV002051800 |
classification_tum | MSR 100f |
ctrlnum | (OCoLC)631670604 (DE-599)BVBBV002051800 |
discipline | Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01371nam a2200325 c 4500</leader><controlfield tag="001">BV002051800</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1985 ad|| |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)631670604</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002051800</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MSR 100f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Instrumentation and Measurement Technology Conference</subfield><subfield code="n">2</subfield><subfield code="d">1985</subfield><subfield code="c">Tampa, Fla.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5002886-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings IMTC 85</subfield><subfield code="b">IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla.</subfield><subfield code="c">Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE Service Center</subfield><subfield code="c">1985</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">285 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrische Messtechnik</subfield><subfield code="0">(DE-588)4124827-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1985</subfield><subfield code="z">Tampa Fla.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektrische Messtechnik</subfield><subfield code="0">(DE-588)4124827-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001341688</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1985 Tampa Fla. gnd-content |
genre_facet | Konferenzschrift 1985 Tampa Fla. |
id | DE-604.BV002051800 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:39:31Z |
institution | BVB |
institution_GND | (DE-588)5002886-8 (DE-588)1692-5 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001341688 |
oclc_num | 631670604 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 285 S. Ill., graph. Darst. |
publishDate | 1985 |
publishDateSearch | 1985 |
publishDateSort | 1985 |
publisher | IEEE Service Center |
record_format | marc |
spelling | Instrumentation and Measurement Technology Conference 2 1985 Tampa, Fla. Verfasser (DE-588)5002886-8 aut Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers* Piscataway, NJ IEEE Service Center 1985 285 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Elektrische Messtechnik (DE-588)4124827-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1985 Tampa Fla. gnd-content Elektrische Messtechnik (DE-588)4124827-2 s DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
spellingShingle | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. Elektrische Messtechnik (DE-588)4124827-2 gnd |
subject_GND | (DE-588)4124827-2 (DE-588)1071861417 |
title | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. |
title_auth | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. |
title_exact_search | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. |
title_full | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers* |
title_fullStr | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers* |
title_full_unstemmed | Proceedings IMTC 85 IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. Instrumentation and Measurement Technology Conference <1985, Tampa, Fla.> ; Institute of Electrical and Electronics Engineers* |
title_short | Proceedings IMTC 85 |
title_sort | proceedings imtc 85 ieee instrumentation and measurement technology conference march 20 22 1985 hyatt regency hotel tampa fla |
title_sub | IEEE Instrumentation and Measurement Technology Conference, March 20 - 22, 1985, Hyatt Regency Hotel, Tampa, Fla. |
topic | Elektrische Messtechnik (DE-588)4124827-2 gnd |
topic_facet | Elektrische Messtechnik Konferenzschrift 1985 Tampa Fla. |
work_keys_str_mv | AT instrumentationandmeasurementtechnologyconferencetampafla proceedingsimtc85ieeeinstrumentationandmeasurementtechnologyconferencemarch20221985hyattregencyhoteltampafla AT instituteofelectricalandelectronicsengineers proceedingsimtc85ieeeinstrumentationandmeasurementtechnologyconferencemarch20221985hyattregencyhoteltampafla |