Testing's changing role: proceedings ... ; October 18 - 20, 1983
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Silver Spring, Md.
IEEE Comp. Soc.
1983
|
| Schlagworte: | |
| Beschreibung: | XXV, 806 S. zahlr. graph. Darst. |
| ISBN: | 0818605022 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV002040898 | ||
| 003 | DE-604 | ||
| 005 | 19940118 | ||
| 007 | t | ||
| 008 | 890928s1983 d||| |||| 10||| und d | ||
| 020 | |a 0818605022 |9 0-8186-0502-2 | ||
| 035 | |a (OCoLC)631565332 | ||
| 035 | |a (DE-599)BVBBV002040898 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-91 |a DE-91G | ||
| 084 | |a ELT 238f |2 stub | ||
| 245 | 1 | 0 | |a Testing's changing role |b proceedings ... ; October 18 - 20, 1983 |c Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee* |
| 264 | 1 | |a Silver Spring, Md. |b IEEE Comp. Soc. |c 1983 | |
| 300 | |a XXV, 806 S. |b zahlr. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z Cherry Hill NY |2 gnd-content | |
| 689 | 0 | 0 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | 1 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a IEEE Computer Society |b Test Technology Committee |e Sonstige |0 (DE-588)212659-X |4 oth | |
| 711 | 2 | |a International Test Conference |d 1983 |c Cherry Hill, NJ |j Sonstige |0 (DE-588)5002196-5 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001334635 | ||
Datensatz im Suchindex
| _version_ | 1804116491238375424 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002040898 |
| classification_tum | ELT 238f |
| ctrlnum | (OCoLC)631565332 (DE-599)BVBBV002040898 |
| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01412nam a2200349 c 4500</leader><controlfield tag="001">BV002040898</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19940118 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1983 d||| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818605022</subfield><subfield code="9">0-8186-0502-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)631565332</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002040898</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-91G</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 238f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testing's changing role</subfield><subfield code="b">proceedings ... ; October 18 - 20, 1983</subfield><subfield code="c">Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Silver Spring, Md.</subfield><subfield code="b">IEEE Comp. Soc.</subfield><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXV, 806 S.</subfield><subfield code="b">zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">Cherry Hill NY</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">IEEE Computer Society</subfield><subfield code="b">Test Technology Committee</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)212659-X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="d">1983</subfield><subfield code="c">Cherry Hill, NJ</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5002196-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001334635</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1983 Cherry Hill NY gnd-content |
| genre_facet | Konferenzschrift 1983 Cherry Hill NY |
| id | DE-604.BV002040898 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:39:21Z |
| institution | BVB |
| institution_GND | (DE-588)212659-X (DE-588)5002196-5 |
| isbn | 0818605022 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001334635 |
| oclc_num | 631565332 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-91G DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM DE-91G DE-BY-TUM |
| physical | XXV, 806 S. zahlr. graph. Darst. |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| publisher | IEEE Comp. Soc. |
| record_format | marc |
| spelling | Testing's changing role proceedings ... ; October 18 - 20, 1983 Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee* Silver Spring, Md. IEEE Comp. Soc. 1983 XXV, 806 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 Cherry Hill NY gnd-content Prüftechnik (DE-588)4047610-8 s Elektronische Schaltung (DE-588)4113419-9 s DE-604 IEEE Computer Society Test Technology Committee Sonstige (DE-588)212659-X oth International Test Conference 1983 Cherry Hill, NJ Sonstige (DE-588)5002196-5 oth |
| spellingShingle | Testing's changing role proceedings ... ; October 18 - 20, 1983 Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4047610-8 (DE-588)1071861417 |
| title | Testing's changing role proceedings ... ; October 18 - 20, 1983 |
| title_auth | Testing's changing role proceedings ... ; October 18 - 20, 1983 |
| title_exact_search | Testing's changing role proceedings ... ; October 18 - 20, 1983 |
| title_full | Testing's changing role proceedings ... ; October 18 - 20, 1983 Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee* |
| title_fullStr | Testing's changing role proceedings ... ; October 18 - 20, 1983 Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee* |
| title_full_unstemmed | Testing's changing role proceedings ... ; October 18 - 20, 1983 Urheber: International Test Conference <14, 1983, Philadelphia, Pa.>. KR: Computer Society / Test Technology Committee* |
| title_short | Testing's changing role |
| title_sort | testing s changing role proceedings october 18 20 1983 |
| title_sub | proceedings ... ; October 18 - 20, 1983 |
| topic | Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Elektronische Schaltung Prüftechnik Konferenzschrift 1983 Cherry Hill NY |
| work_keys_str_mv | AT ieeecomputersocietytesttechnologycommittee testingschangingroleproceedingsoctober18201983 AT internationaltestconferencecherryhillnj testingschangingroleproceedingsoctober18201983 |