The three faces of test: design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Silver Spring, Md.
IEEE Comp. Soc.
1984
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XXXI, 886 S. zahlr. graph. Darst. |
| ISBN: | 0818605480 0818645482 0818685484 |
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Datensatz im Suchindex
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| genre_facet | Konferenzschrift 1984 Philadelphia Pa. |
| id | DE-604.BV002040897 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T15:24:07Z |
| institution | BVB |
| institution_GND | (DE-588)212659-X (DE-588)5002693-8 |
| isbn | 0818605480 0818645482 0818685484 |
| language | Undetermined |
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| physical | XXXI, 886 S. zahlr. graph. Darst. |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | IEEE Comp. Soc. |
| record_format | marc |
| spelling | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 Internat. Test Conference 1984 Silver Spring, Md. IEEE Comp. Soc. 1984 XXXI, 886 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1984 Philadelphia Pa. gnd-content Prüftechnik (DE-588)4047610-8 s Mikroelektronik (DE-588)4039207-7 s DE-604 IEEE Computer Society Test Technology Committee Sonstige (DE-588)212659-X oth International Test Conference 1984 Philadelphia, Pa. Sonstige (DE-588)5002693-8 oth |
| spellingShingle | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 |
| title | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 |
| title_auth | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 |
| title_exact_search | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 |
| title_full | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 Internat. Test Conference 1984 |
| title_fullStr | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 Internat. Test Conference 1984 |
| title_full_unstemmed | The three faces of test design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 Internat. Test Conference 1984 |
| title_short | The three faces of test |
| title_sort | the three faces of test design characterization production proceedings oct 16 17 18 1984 |
| title_sub | design, characterization, production ; proceedings, Oct. 16, 17, 18, 1984 |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 1984 Philadelphia Pa. |
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