Design of systems and circuits: for maximum reliability of maximum production yield
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York (u.a.)
McGraw-Hill
1977
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Schlagworte: | |
Beschreibung: | XIV, 293 S. graph. Darst. |
Internformat
MARC
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035 | |a (OCoLC)2225095 | ||
035 | |a (DE-599)BVBBV002015415 | ||
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100 | 1 | |a Becker, Peter W. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Design of systems and circuits |b for maximum reliability of maximum production yield |c Peter W. Becker ; Finn Jensen* |
264 | 1 | |a New York (u.a.) |b McGraw-Hill |c 1977 | |
300 | |a XIV, 293 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Datenverarbeitung | |
650 | 4 | |a Electronic apparatus and appliances |x Reliability |x Data processing | |
650 | 4 | |a Electronic circuit design |x Data processing | |
650 | 4 | |a Electronic systems |x Design and construction |x Data processing | |
700 | 1 | |a Jensen, Finn |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-001315629 |
Datensatz im Suchindex
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any_adam_object | |
author | Becker, Peter W. Jensen, Finn |
author_facet | Becker, Peter W. Jensen, Finn |
author_role | aut aut |
author_sort | Becker, Peter W. |
author_variant | p w b pw pwb f j fj |
building | Verbundindex |
bvnumber | BV002015415 |
callnumber-first | T - Technology |
callnumber-label | TK7867 |
callnumber-raw | TK7867 |
callnumber-search | TK7867 |
callnumber-sort | TK 47867 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)2225095 (DE-599)BVBBV002015415 |
dewey-full | 621.3815/3/02854044 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/3/02854044 |
dewey-search | 621.3815/3/02854044 |
dewey-sort | 3621.3815 13 72854044 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV002015415 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:38:55Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001315629 |
oclc_num | 2225095 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | XIV, 293 S. graph. Darst. |
publishDate | 1977 |
publishDateSearch | 1977 |
publishDateSort | 1977 |
publisher | McGraw-Hill |
record_format | marc |
spelling | Becker, Peter W. Verfasser aut Design of systems and circuits for maximum reliability of maximum production yield Peter W. Becker ; Finn Jensen* New York (u.a.) McGraw-Hill 1977 XIV, 293 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Datenverarbeitung Electronic apparatus and appliances Reliability Data processing Electronic circuit design Data processing Electronic systems Design and construction Data processing Jensen, Finn Verfasser aut |
spellingShingle | Becker, Peter W. Jensen, Finn Design of systems and circuits for maximum reliability of maximum production yield Datenverarbeitung Electronic apparatus and appliances Reliability Data processing Electronic circuit design Data processing Electronic systems Design and construction Data processing |
title | Design of systems and circuits for maximum reliability of maximum production yield |
title_auth | Design of systems and circuits for maximum reliability of maximum production yield |
title_exact_search | Design of systems and circuits for maximum reliability of maximum production yield |
title_full | Design of systems and circuits for maximum reliability of maximum production yield Peter W. Becker ; Finn Jensen* |
title_fullStr | Design of systems and circuits for maximum reliability of maximum production yield Peter W. Becker ; Finn Jensen* |
title_full_unstemmed | Design of systems and circuits for maximum reliability of maximum production yield Peter W. Becker ; Finn Jensen* |
title_short | Design of systems and circuits |
title_sort | design of systems and circuits for maximum reliability of maximum production yield |
title_sub | for maximum reliability of maximum production yield |
topic | Datenverarbeitung Electronic apparatus and appliances Reliability Data processing Electronic circuit design Data processing Electronic systems Design and construction Data processing |
topic_facet | Datenverarbeitung Electronic apparatus and appliances Reliability Data processing Electronic circuit design Data processing Electronic systems Design and construction Data processing |
work_keys_str_mv | AT beckerpeterw designofsystemsandcircuitsformaximumreliabilityofmaximumproductionyield AT jensenfinn designofsystemsandcircuitsformaximumreliabilityofmaximumproductionyield |