Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements: Tokyo, 26-30 August, 1974
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Tokyo
1974
|
| Series: | Japanese journal of applied physics / Suppl.
14,1 |
| Subjects: | |
| Physical Description: | XIII, 544 S. Ill., graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV001974274 | ||
| 003 | DE-604 | ||
| 005 | 20160202 | ||
| 007 | t | ||
| 008 | 890928s1974 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)258458382 | ||
| 035 | |a (DE-599)BVBBV001974274 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-91G | ||
| 111 | 2 | |a Conference on Optical Methods in Scientific and Industrial Measurements |d 1974 |c Tokio |j Verfasser |0 (DE-588)5099129-2 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements |b Tokyo, 26-30 August, 1974 |c ed. by Shun-ichi Tanaka |
| 246 | 1 | 3 | |a Optical methods in scientific and industrial measurements |
| 264 | 1 | |a Tokyo |c 1974 | |
| 300 | |a XIII, 544 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Japanese journal of applied physics / Suppl. |v 14,1 | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1974 |z Tokio |2 gnd-content | |
| 689 | 0 | 0 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Tanaka, Shun-ichi |e Sonstige |4 oth | |
| 710 | 2 | |a International Commission for Optics |e Sonstige |0 (DE-588)1460-6 |4 oth | |
| 810 | 2 | |a Suppl. |t Japanese journal of applied physics |v 14,1 |w (DE-604)BV001888390 |9 14,1 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001287718 | ||
Record in the Search Index
| _version_ | 1804116418567864320 |
|---|---|
| any_adam_object | |
| author_corporate | Conference on Optical Methods in Scientific and Industrial Measurements Tokio |
| author_corporate_role | aut |
| author_facet | Conference on Optical Methods in Scientific and Industrial Measurements Tokio |
| author_sort | Conference on Optical Methods in Scientific and Industrial Measurements Tokio |
| building | Verbundindex |
| bvnumber | BV001974274 |
| ctrlnum | (OCoLC)258458382 (DE-599)BVBBV001974274 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01441nam a2200349 cb4500</leader><controlfield tag="001">BV001974274</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160202 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">890928s1974 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)258458382</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV001974274</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-91G</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Conference on Optical Methods in Scientific and Industrial Measurements</subfield><subfield code="d">1974</subfield><subfield code="c">Tokio</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5099129-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements</subfield><subfield code="b">Tokyo, 26-30 August, 1974</subfield><subfield code="c">ed. by Shun-ichi Tanaka</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Optical methods in scientific and industrial measurements</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Tokyo</subfield><subfield code="c">1974</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 544 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Japanese journal of applied physics / Suppl.</subfield><subfield code="v">14,1</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1974</subfield><subfield code="z">Tokio</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tanaka, Shun-ichi</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">International Commission for Optics</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1460-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Suppl.</subfield><subfield code="t">Japanese journal of applied physics</subfield><subfield code="v">14,1</subfield><subfield code="w">(DE-604)BV001888390</subfield><subfield code="9">14,1</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001287718</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1974 Tokio gnd-content |
| genre_facet | Konferenzschrift 1974 Tokio |
| id | DE-604.BV001974274 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:38:12Z |
| institution | BVB |
| institution_GND | (DE-588)5099129-2 (DE-588)1460-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001287718 |
| oclc_num | 258458382 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-91G DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM DE-91G DE-BY-TUM |
| physical | XIII, 544 S. Ill., graph. Darst. |
| publishDate | 1974 |
| publishDateSearch | 1974 |
| publishDateSort | 1974 |
| record_format | marc |
| series2 | Japanese journal of applied physics / Suppl. |
| spelling | Conference on Optical Methods in Scientific and Industrial Measurements 1974 Tokio Verfasser (DE-588)5099129-2 aut Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 ed. by Shun-ichi Tanaka Optical methods in scientific and industrial measurements Tokyo 1974 XIII, 544 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Japanese journal of applied physics / Suppl. 14,1 Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1974 Tokio gnd-content Optische Messtechnik (DE-588)4172667-4 s DE-604 Tanaka, Shun-ichi Sonstige oth International Commission for Optics Sonstige (DE-588)1460-6 oth Suppl. Japanese journal of applied physics 14,1 (DE-604)BV001888390 14,1 |
| spellingShingle | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 Optische Messtechnik (DE-588)4172667-4 gnd |
| subject_GND | (DE-588)4172667-4 (DE-588)1071861417 |
| title | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 |
| title_alt | Optical methods in scientific and industrial measurements |
| title_auth | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 |
| title_exact_search | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 |
| title_full | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 ed. by Shun-ichi Tanaka |
| title_fullStr | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 ed. by Shun-ichi Tanaka |
| title_full_unstemmed | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements Tokyo, 26-30 August, 1974 ed. by Shun-ichi Tanaka |
| title_short | Proceedings of the ICO Conference on Optical Methods in Scientific and Industrial Measurements |
| title_sort | proceedings of the ico conference on optical methods in scientific and industrial measurements tokyo 26 30 august 1974 |
| title_sub | Tokyo, 26-30 August, 1974 |
| topic | Optische Messtechnik (DE-588)4172667-4 gnd |
| topic_facet | Optische Messtechnik Konferenzschrift 1974 Tokio |
| volume_link | (DE-604)BV001888390 |
| work_keys_str_mv | AT conferenceonopticalmethodsinscientificandindustrialmeasurementstokio proceedingsoftheicoconferenceonopticalmethodsinscientificandindustrialmeasurementstokyo2630august1974 AT tanakashunichi proceedingsoftheicoconferenceonopticalmethodsinscientificandindustrialmeasurementstokyo2630august1974 AT internationalcommissionforoptics proceedingsoftheicoconferenceonopticalmethodsinscientificandindustrialmeasurementstokyo2630august1974 AT conferenceonopticalmethodsinscientificandindustrialmeasurementstokio opticalmethodsinscientificandindustrialmeasurements AT tanakashunichi opticalmethodsinscientificandindustrialmeasurements AT internationalcommissionforoptics opticalmethodsinscientificandindustrialmeasurements |