Physical aspects of electron microscopy and microbeam analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Wiley
1975
|
| Schriftenreihe: | A Wiley biomedical-health publication.
|
| Schlagworte: | |
| Beschreibung: | XIII, 474 S. zahlr. Ill. u. graph. Darst. |
| ISBN: | 0471790206 |
Internformat
MARC
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Datensatz im Suchindex
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| id | DE-604.BV001960220 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:37:57Z |
| institution | BVB |
| institution_GND | (DE-588)1033501-8 |
| isbn | 0471790206 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001278192 |
| oclc_num | 1085871 |
| open_access_boolean | |
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| owner_facet | DE-355 DE-BY-UBR DE-83 DE-188 |
| physical | XIII, 474 S. zahlr. Ill. u. graph. Darst. |
| psigel | TUB-nseb |
| publishDate | 1975 |
| publishDateSearch | 1975 |
| publishDateSort | 1975 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley biomedical-health publication. |
| spelling | Physical aspects of electron microscopy and microbeam analysis Auftraggeber: Electron Microscopy Society of America. Hrsg. von Benjamin M. Siegel* New York, NY Wiley 1975 XIII, 474 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley biomedical-health publication. Electron Microscopy cabt Electron Probe Microanalysis Electron microscopy Microchemistry Microprobe analysis Microscopy, Electron Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Siegel, Benjamin M. Sonstige oth Electron Microscopy Society of America Sonstige (DE-588)1033501-8 oth |
| spellingShingle | Physical aspects of electron microscopy and microbeam analysis Electron Microscopy cabt Electron Probe Microanalysis Electron microscopy Microchemistry Microprobe analysis Microscopy, Electron Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Physical aspects of electron microscopy and microbeam analysis |
| title_auth | Physical aspects of electron microscopy and microbeam analysis |
| title_exact_search | Physical aspects of electron microscopy and microbeam analysis |
| title_full | Physical aspects of electron microscopy and microbeam analysis Auftraggeber: Electron Microscopy Society of America. Hrsg. von Benjamin M. Siegel* |
| title_fullStr | Physical aspects of electron microscopy and microbeam analysis Auftraggeber: Electron Microscopy Society of America. Hrsg. von Benjamin M. Siegel* |
| title_full_unstemmed | Physical aspects of electron microscopy and microbeam analysis Auftraggeber: Electron Microscopy Society of America. Hrsg. von Benjamin M. Siegel* |
| title_short | Physical aspects of electron microscopy and microbeam analysis |
| title_sort | physical aspects of electron microscopy and microbeam analysis |
| topic | Electron Microscopy cabt Electron Probe Microanalysis Electron microscopy Microchemistry Microprobe analysis Microscopy, Electron Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron Microscopy Electron Probe Microanalysis Electron microscopy Microchemistry Microprobe analysis Microscopy, Electron Elektronenmikroskopie |
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