Computed electron micrographs and defect identification:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
North-Holland
1973
|
| Schriftenreihe: | Defects in crystalline solids
7 |
| Schlagworte: | |
| Beschreibung: | X, 400 S. |
| ISBN: | 0720417570 0444104623 |
Internformat
MARC
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| 245 | 1 | 0 | |a Computed electron micrographs and defect identification |c A. K. Head ... |
| 264 | 1 | |a Amsterdam [u.a.] |b North-Holland |c 1973 | |
| 300 | |a X, 400 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Defects in crystalline solids |v 7 | |
| 650 | 7 | |a Computersimulaties |2 gtt | |
| 650 | 4 | |a Cristallographie - Informatique | |
| 650 | 4 | |a Cristaux - Défauts | |
| 650 | 7 | |a Elektronendiffractie |2 gtt | |
| 650 | 7 | |a Elektronenmicroscopie |2 gtt | |
| 650 | 7 | |a Roosterfouten |2 gtt | |
| 650 | 7 | |a Vastestoffysica |2 gtt | |
| 650 | 7 | |a cristallographie |2 inriac | |
| 650 | 7 | |a diffraction |2 inriac | |
| 650 | 7 | |a dislocation |2 inriac | |
| 650 | 7 | |a identification défaut |2 inriac | |
| 650 | 7 | |a physique |2 inriac | |
| 650 | 4 | |a Électrons - Diffraction | |
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Electron microscopy |x Data processing | |
| 650 | 4 | |a Metals |x Defects |x Data processing | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Head, A. K. |e Sonstige |4 oth | |
| 830 | 0 | |a Defects in crystalline solids |v 7 |w (DE-604)BV002002106 |9 7 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001273221 | ||
Datensatz im Suchindex
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| dewey-full | 548/.83 548/.842/02854 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
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| dewey-search | 548/.83 548/.842/02854 |
| dewey-sort | 3548 283 |
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| discipline | Chemie / Pharmazie Physik |
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| id | DE-604.BV001953162 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:37:49Z |
| institution | BVB |
| isbn | 0720417570 0444104623 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001273221 |
| oclc_num | 887441 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM DE-188 DE-11 DE-83 DE-706 DE-355 DE-BY-UBR |
| owner_facet | DE-91G DE-BY-TUM DE-188 DE-11 DE-83 DE-706 DE-355 DE-BY-UBR |
| physical | X, 400 S. |
| publishDate | 1973 |
| publishDateSearch | 1973 |
| publishDateSort | 1973 |
| publisher | North-Holland |
| record_format | marc |
| series | Defects in crystalline solids |
| series2 | Defects in crystalline solids |
| spelling | Computed electron micrographs and defect identification A. K. Head ... Amsterdam [u.a.] North-Holland 1973 X, 400 S. txt rdacontent n rdamedia nc rdacarrier Defects in crystalline solids 7 Computersimulaties gtt Cristallographie - Informatique Cristaux - Défauts Elektronendiffractie gtt Elektronenmicroscopie gtt Roosterfouten gtt Vastestoffysica gtt cristallographie inriac diffraction inriac dislocation inriac identification défaut inriac physique inriac Électrons - Diffraction Datenverarbeitung Electron microscopy Data processing Metals Defects Data processing Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Head, A. K. Sonstige oth Defects in crystalline solids 7 (DE-604)BV002002106 7 |
| spellingShingle | Computed electron micrographs and defect identification Defects in crystalline solids Computersimulaties gtt Cristallographie - Informatique Cristaux - Défauts Elektronendiffractie gtt Elektronenmicroscopie gtt Roosterfouten gtt Vastestoffysica gtt cristallographie inriac diffraction inriac dislocation inriac identification défaut inriac physique inriac Électrons - Diffraction Datenverarbeitung Electron microscopy Data processing Metals Defects Data processing Elektronenmikroskopie (DE-588)4014327-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4125030-8 |
| title | Computed electron micrographs and defect identification |
| title_auth | Computed electron micrographs and defect identification |
| title_exact_search | Computed electron micrographs and defect identification |
| title_full | Computed electron micrographs and defect identification A. K. Head ... |
| title_fullStr | Computed electron micrographs and defect identification A. K. Head ... |
| title_full_unstemmed | Computed electron micrographs and defect identification A. K. Head ... |
| title_short | Computed electron micrographs and defect identification |
| title_sort | computed electron micrographs and defect identification |
| topic | Computersimulaties gtt Cristallographie - Informatique Cristaux - Défauts Elektronendiffractie gtt Elektronenmicroscopie gtt Roosterfouten gtt Vastestoffysica gtt cristallographie inriac diffraction inriac dislocation inriac identification défaut inriac physique inriac Électrons - Diffraction Datenverarbeitung Electron microscopy Data processing Metals Defects Data processing Elektronenmikroskopie (DE-588)4014327-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Computersimulaties Cristallographie - Informatique Cristaux - Défauts Elektronendiffractie Elektronenmicroscopie Roosterfouten Vastestoffysica cristallographie diffraction dislocation identification défaut physique Électrons - Diffraction Datenverarbeitung Electron microscopy Data processing Metals Defects Data processing Elektronenmikroskopie Gitterbaufehler |
| volume_link | (DE-604)BV002002106 |
| work_keys_str_mv | AT headak computedelectronmicrographsanddefectidentification |