X-ray microscopy and X-ray microanalysis: proceedings of the second international symposium (Stockholm, 1960)
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] Elsevier 1960
Subjects:
Physical Description:X, 542 S. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!