Transmission electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1989
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| Ausgabe: | 2. ed. |
| Schriftenreihe: | Springer series in optical sciences
36 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturverz. S. 465 - 536 |
| Beschreibung: | XIII, 547 S. Ill., zahlr. graph. Darst. |
| ISBN: | 3540504990 0387504990 |
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| 245 | 1 | 0 | |a Transmission electron microscopy |b physics of image formation and microanalysis |c Ludwig Reimer |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 1989 | |
| 300 | |a XIII, 547 S. |b Ill., zahlr. graph. Darst. | ||
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| 490 | 1 | |a Springer series in optical sciences |v 36 | |
| 500 | |a Literaturverz. S. 465 - 536 | ||
| 650 | 7 | |a Microscopie électronique - Transmission |2 ram | |
| 650 | 4 | |a Microscopie électronique à transmission | |
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Datensatz im Suchindex
| _version_ | 1804116307210141696 |
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| adam_text | LUDWIG REIMER TRANSMISSION ELECTRON MICROSCOPY PHYSICS OF IMAGE
FORMATION AND MICROANALYSIS SECOND EDITION WITH 263 FIGURES
SPRINGER-VERLAG BERLIN HEIDELBERG NEW YORK LONDON PARIS TOKYO CONTENTS
1. INTRODUCTION 1 1.1 TYPES OF ELECTRON MICROSCOPE 1 1.1.1 ELECTRON
MICROSCOPES FOR THE DIRECT IMAGING OF SURFACES OF BULK SPECIMENS 1 1.1.2
INSTRUMENTS USING ELECTRON MICROPROBES 3 1.1.3 TRANSMISSION ELECTRON
MICROSCOPES 6 1.2 ELECTRON-SPECIMEN INTERACTIONS AND THEIR APPLICATIONS
. . 8 1.2.1 ELASTIC SCATTERING 8 1.2.2 ELECTRON DIFFRACTION 9 1.2.3
INELASTIC SCATTERING AND X-RAY EMISSION 10 1.3 SPECIAL APPLICATIONS OF
TRANSMISSION ELECTRPN MICROSCOPY . 11 1.3.1 HIGH-RESOLUTION ELECTRON
MICROSCOPY 11 1.3.2 ANALYTICAL ELECTRON MICROSCOPY 14 1.3.3 HIGH VOLTAGE
ELECTRON MICROSCOPY 15 2. PARTICLE OPTICS OF ELECTRONS 19 2.1
ACCELERATION AND DEFLECTION OF ELECTRONS . 19 2.1.1 RELATIVISTIC
MECHANICS OF ELECTRON ACCELERATION . . . 19 2.1.2 ELECTRON TRAJECTORIES
IN HOMOGENEOUS MAGNETIC FIELDS 22 2.1.3 SMALL-ANGLE DEFLECTIONS IN
ELECTRIC AND MAGNETIC FIELDS 24 2.2 ELECTRON LENSES 26 2.2.1 ELECTRON
TRAJECTORIES IN A MAGNETIC FIELD OF ROTATIONAL SYMMETRY 26 2.2.2 OPTICS
OF AN ELECTRON LENS WITH A BELL-SHAPED FIELD . 28 2.2.3 SPECIAL ELECTRON
LENSES 33 2.3 LENS ABERRATIONS 37 2.3.1 CLASSIFICATION OF LENS
ABERRATIONS 37 2.3.2 SPHERICAL ABERRATION 37 2.3.3 ASTIGMATISM AND FIELD
CURVATURE 39 2.3.4 DISTORTION AND COMA 41 2.3.5 ANISOTROPIC ABERRATIONS
43 2.3.6 CHROMATIC ABERRATION 44 2.3.7 CORRECTIONS OF LENS ABERRATIONS .
. 45 VIII CONTENTS 3. WAVE OPTICS OF ELECTRONS 50 I 3.1 ELECTRON WAVES
AND PHASE SHIFTS 50 ; 3.1.1 DE BROGLIE WAVES 50 I 3.1.2 PROBABILITY
DENSITY AND WAVE PACKETS 55 3.1.3 ELECTRON-OPTICAL REFRACTIVE INDEX AND
THE SCHRODINGER EQUATION 56 3.1.4 ELECTRON INTERFEROMETRY AND COHERENCE
59 3.1.5 PHASE SHIFT BY MAGNETIC FIELDS 62 3.2 FRESNEL AND FRAUNHOFER
DIFFRACTION 63 3.2.1 HUYGENS PRINCIPLE AND FRESNEL DIFFRACTION 63 3.2.2
FRESNEL FRINGES 67 3.2.3 FRAUNHOFER DIFFRACTION 70 3.2.4 MATHEMATICS OF
FOURIER TRANSFORMS 72 3.3 WAVE-OPTICAL FORMULATION OF IMAGING 79 3.3.1
WAVE ABERRATION OF AN ELECTRON LENS 79 3.3.2 WAVE-OPTICAL THEORY OF
IMAGING 83 4. ELEMENTS OF A TRANSMISSION ELECTRON MICROSCOPE 86 4.1
ELECTRON GUNS 86 4.1.1 PHYSICS OF ELECTRON EMISSION 86 4.1.2 ENERGY
SPREAD AND GUN BRIGHTNESS 89 4.1.3 THERMIONIC ELECTRON GUNS - 92 4.1.4
FIELD-EMISSION GUNS 97 4.2 THE ILLUMINATION SYSTEM OF A TEM 99 4.2.1
TWO-LENS CONDENSER SYSTEM 99 4.2.2 ELECTRON-PROBE FORMATION 102 4.2.3
ILLUMINATION WITH AN OBJECTIVE PRE-FIELD LENS .. . . 106 4.3 SPECIMENS
108 4.3.1 USEFUL SPECIMEN THICKNESS 108 4.3.2 SPECIMEN MOUNTING 109
4.3.3 SPECIMEN MANIPULATION 110 4.4 THE IMAGING SYSTEM OF A TEM 112
4.4.1 OBJECTIVE-LENS SYSTEM 112 4.4.2 IMAGING MODES OF A TEM 114 4.4.3
MAGNIFICATION AND CALIBRATION 117 4.4.4 DEPTH OF IMAGE AND DEPTH OF
FOCUS 118 4.5 SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) . . . .
120 4.5.1 SCANNING TRANSMISSION MODE OF TEM 120 4.5.2 FIELD-EMISSION
STEM 122 4.5.3 THEOREM OF RECIPROCITY 123 4.6 IMAGE RECORDING AND
ELECTRON DETECTION 125 4.6.1 FLUORESCENT SCREENS 125 4.6.2 PHOTOGRAPHIC
EMULSIONS 126 4.6.3 IMAGE INTENSIFICATION 131 4.6.4 FARADAY CAGES 132
CONTENTS IX 4.6.5 SEMICONDUCTOR DETECTORS AND DIODE ARRAYS 133 4.6.6
SCINTILLATION DETECTORS 134 ELECTRON-SPECIMEN INTERACTIONS 136 5.1
ELASTIC SCATTERING 136 5.1.1 CROSS-SECTION AND MEAN FREE PATH 136 5.1.2
ENERGY TRANSFER IN AN ELECTRON-NUCLEUS COLLISION . . 139 5.1.3 ELASTIC
DIFFERENTIAL CROSS-SECTION FOR SMALL-ANGLE SCATTERING 141 5.1.4
DIFFERENTIAL CROSS-SECTION FOR LARGE-ANGLE SCATTERING 149 5.1.5 TOTAL
ELASTIC CROSS-SECTION . . 151 5.2 INELASTIC SCATTERING 152 5.2.1
ELECTRON-SPECIMEN INTERACTIONS WITH ENERGY LOSS . 152 5.2.2 DIFFERENTIAL
CROSS-SECTION FOR SINGLE ELECTRON EXCITATION 154 5.2.3 APPROXIMATION FOR
THE TOTAL INELASTIC CROSS-SECTION OF AN ATOM 158 5.2.4 DIELECTRIC THEORY
AND PLASMON LOSSES IN SOLIDS . . . 160 5.2.5 SURFACE PLASMON LOSSES 166
5.3 ENERGY LOSS BY INNER-SHELL IONISATION . . ,..* -. 168 5.3.1
POSITION AND PROFILE OF IONISATION EDGES 168 5.3.2 ENERGY-LOSS NEAR-EDGE
STRUCTURE (ELNES) .... 172 5.3.3 EXTENDED ENERGY-LOSS FINE STRUCTURE
(EXELFS) . . 174 5.4 MULTIPLE-SCATTERING EFFECTS 175 5.4.1 ANGULAR
DISTRIBUTION OF SCATTERED ELECTRONS 175 5.4.2 ENERGY DISTRIBUTION OF
TRANSMITTED ELECTRONS .... 177 5.4.3 ELECTRON-PROBE BROADENING BY
MULTIPLE SCATTERING . 180 5.4.4 ELECTRON DIFFUSION, BACKSCATTERING AND
SECONDARY-ELECTRON EMISSION 183 5.5 X-RAY AND AUGER-ELECTRON EMISSION
186 5.5.1 X-RAY CONTINUUM 186 5.5.2 CHARACTERISTIC X-RAY AND
AUGER-ELECTRON EMISSION . 187 SCATTERING AND PHASE CONTRAST FOR
AMORPHOUS SPECIMENS 192 6.1 SCATTERING CONTRAST 193 6.1.1 TRANSMISSION
IN THE BRIGHT-FIELD MODE 193 6.1.2 DARK-FIELD MODE 199 6.1.3 EXAMPLES OF
SCATTERING CONTRAST 200 6.1.4 SCATTERING CONTRAST IN THE STEM MODE 202
6.1.5 MEASUREMENT OF MASS-THICKNESS AND TOTAL MASS . . 204 6.2 PHASE
CONTRAST 206 6.2.1 THE ORIGIN OF PHASE CONTRAST 206 6.2.2 DEFOCUSING
PHASE CONTRAST OF SUPPORTING FILMS . . . 207 X CONTENTS 6.2.3 EXAMPLES
OF PHASE CONTRAST OF SMALL PARTICLES AND LAMELLAR SYSTEMS 209 6.2.4
THEORETICAL METHODS FOR CALCULATING PHASE CONTRAST 211 6.3 IMAGING OF
SINGLE ATOMS 212 6.3.1 IMAGING OF A POINT OBJECT 212 6.3.2 IMAGING OF
SINGLE ATOMS IN TEM 215 6.3.3 COMPLEX SCATTERING AMPLITUDES AND
SCATTERING CONTRAST 218 6.3.4 DEPENDENCE OF PHASE CONTRAST ON ELECTRON
ENERGY 220 6.3.5 IMAGING OF SINGLE ATOMS IN THE STEM MODE . . . . 221
6.4 CONTRAST-TRANSFER FUNCTION (CTF) 224 6.4.1 THE CTF FOR AMPLITUDE AND
PHASE SPECIMENS . ... 224 6.4.2 INFLUENCE OF ENERGY SPREAD AND
ILLUMINATION APERTURE 226 6.4.3 THE CTF FOR TILTED-BEAM AND HOLLOW-CONE
ILLUMINATION 229 6.4.4 CONTRAST TRANSFER IN STEM 232 6.4.5 IMPROVEMENT
OF THE CTF INSIDE THE MICROSCOPE . . . 233 6.4.6 CONTROL AND MEASUREMENT
OF THE CTF BY OPTICAL DIFFRACTION 234 6.5 ELECTRON HOLOGRAPHY .,. 239
6.5.1 FRESNEL AND FRAUNHOFER IN-LINE HOLOGRAPHY . . . . 239 6.5.2
SINGLE-SIDEBAND HOLOGRAPHY 242 6.5.3 OFF-AXIS HOLOGRAPHY 243 I 6.5.4
RECONSTRUCTION OF OFF-AXIS HOLOGRAMS 244 J 6.6 IMAGE PROCESSING 246!
6.6.1 OPTICAL FILTERING AND IMAGE PROCESSING 246 I 6.6.2 DIGITAL IMAGE
PROCESSING 249; 6.6.3 AVERAGING OF PERIODIC AND APERIODIC STRUCTURES ...
251! 6.6.4 THREE-DIMENSIONAL RECONSTRUCTION 255! 6.7 LORENTZ MICROSCOPY
256; 6.7.1 LORENTZ MICROSCOPY AND FRESNEL DIFFRACTION 256; 6.7.2 IMAGING
MODES OF LORENTZ MICROSCOPY 258 6.7.3 IMAGING OF ELECTROSTATIC SPECIMEN
FIELDS 265 7. KINEMATICAL AND DYNAMICAL THEORY OF ELECTRON DIFFRACTION
. . . . 266 7.1 FUNDAMENTALS OF CRYSTALLOGRAPHY 266 7.1.1 BRAVAIS
LATTICE AND LATTICE PLANES 266; 7.1.2 THE RECIPROCAL LATTICE 272- 7.1.3
CALCULATION OF LATTICE-PLANE SPACINGS 275 J 7.1.4 CONSTRUCTION OF LAUE
ZONES 276; 7.2 KINEMATICAL THEORY OF ELECTRON DIFFRACTION 278! 7.2.1
BRAGG CONDITION AND EWALD SPHERE 278 I 7.2.2 STRUCTURE AMPLITUDE AND
LATTICE AMPLITUDE 279] 7.2.3 COLUMN APPROXIMATION 284: CONTENTS XI 7.3
DYNAMICAL THEORY OF ELECTRON DIFFRACTION 286 7.3.1 LIMITATIONS OF THE
KINEMATICAL THEORY 286 7.3.2 FORMULATION OF THE DYNAMICAL THEORY AS A
SYSTEM OF DIFFERENTIAL EQUATIONS 287 7.3.3 FORMULATION OF THE DYNAMICAL
THEORY AS AN EIGENVALUE PROBLEM 288 7.3.4 DISCUSSION OF THE TWO-BEAM
CASE 292 7.4 DYNAMICAL THEORY CONSIDERING ABSORPTION 298 7.4.1
INELASTIC-SCATTERING PROCESSES IN CRYSTALS 298 7.4.2 ABSORPTION OF THE
BLOCH-WAVE FIELD 302 7.4.3 DYNAMICAL N-BEAM THEORY 307 7.4.4 THE BETHE
DYNAMICAL POTENTIAL AND THE CRITICAL-VOLTAGE PHENOMENON 309 7.5
INTENSITY DISTRIBUTIONS IN DIFFRACTION PATTERNS 313 7.5.1 DIFFRACTION AT
AMORPHOUS SPECIMENS 313 7.5.2 INTENSITY OF DEBYE-SCHERRER RINGS 314
7.5.3 INFLUENCE OF THERMAL DIFFUSE SCATTERING 316 7.5.4 KIKUCHI LINES
AND BANDS 318 8. DIFFRACTION CONTRAST AND CRYSTAL-STRUCTURE IMAGING. 321
8.1 DIFFRACTION CONTRAST OF CRYSTALS FREE OF DEFECTS 321 8.1.1 EDGE AND
BEND CONTOURS 321 8.1.2 DARK-FIELD IMAGING 324 8.1.3 THE STEM MODE AND
MULTI-BEAM IMAGING 327 8.1.4 TRANSMISSION BY CRYSTALLINE SPECIMENS 328
8.2 CALCULATION OF DIFFRACTION CONTRAST OF LATTICE DEFECTS . ... 330
8.2.1 KINEMATICAL THEORY AND THE HOWIE-WHELAN EQUATIONS 330 8.2.2
MATRIX-MULTIPLICATION METHOD 332 8.2.3 BLOCH-WAVE METHOD 333 8.3 PLANAR
LATTICE FAULTS 335 8.3.1 KINEMATICAL THEORY OF STACKING-FAULT CONTRAST .
. . 335 8.3.2 DYNAMICAL THEORY OF STACKING-FAULT CONTRAST . . . . 338
8.3.3 ANTIPHASE AND OTHER BOUNDARIES 341 8.4 DISLOCATIONS 344 8.4.1
KINEMATICAL THEORY OF DISLOCATION CONTRAST 344 8.4.2 DYNAMICAL EFFECTS
IN DISLOCATION IMAGES 348 8.4.3 WEAK-BEAM IMAGING 349 8.4.4
DETERMINATION OF THE BURGERS VECTOR 352 8.5 LATTICE DEFECTS OF SMALL
DIMENSIONS 355 8.5.1 COHERENT AND INCOHERENT PRECIPITATES 355 8.5.2
DEFECT CLUSTERS 357 8.6 CRYSTAL-STRUCTURE IMAGING 359 8.6.1 MOIRE
FRINGES 359 XII CONTENTS 8.6.2 LATTICE-PLANE FRINGES 36 8.6.3
CRYSTAL-STRUCTURE IMAGING 36 8.7 IMAGING OF ATOMIC SURFACE STEPS 361
8.7.1 IMAGING OF SURFACE STEPS IN TRANSMISSION 36! 8.7.2 REFLECTION
ELECTRON MICROSCOPY 37; 8.7.3 SURFACE-PROFILE IMAGING 37: 9. ANALYTICAL
ELECTRON MICROSCOPY 37; 9.1 X-RAY MICROANALYSIS IN A TEM 37( 9.1.1
WAVELENGTH-DISPERSIVE SPECTROMETRY 37( 9.1.2 ENERGY-DISPERSIVE
SPECTROMETRY 37 9.1.3 X-RAY EMISSION FROM THIN AND BULK SPECIMENS . . .
38: 9.1.4 STANDARDLESS METHODS FOR THIN SPECIMENS 38 9.1.5 COUNTING
STATISTICS AND SENSITIVITY 38( 9.2 ELECTRON ENERGY-LOSS SPECTROSCOPY AND
ELECTRON SPECTROSCOPIC IMAGING 38I 9.2.1 ELECTRON SPECTROMETERS AND
FILTERS 38I 9.2.2 THE RECORDING AND ANALYSIS OF ELECTRON ENERGY-LOSS
SPECTRA 39 9.2.3 INFORMATION FROM LOW-ENERGY LOSSES 39( 9.2.4 ELEMENTAL
ANALYSIS BY INNER-SHELL IONISATIONS .... 39J 9.2.5 ELECTRON
SPECTROSCOPIC IMAGING 40^ 9.3 ELECTRON-DIFFRACTION MODES 40 9.3.1
SELECTED-AREA ELECTRON DIFFRACTION (SAED) .... 40 9.3.2 ELECTRON
DIFFRACTION USING A ROCKING BEAM . . . . . 40( 9.3.3 ELECTRON
DIFFRACTION USING AN ELECTRON PROBE .... 40 9.3.4 FURTHER DIFFRACTION
MODES IN TEM 41: 9.4 APPLICATIONS OF ELECTRON DIFFRACTION 41 9.4.1
LATTICE-PLANE SPACINGS 41 9.4.2 TEXTURE DIAGRAMS 41( 9.4.3 CRYSTAL
STRUCTURE 41I 9.4.4 CRYSTAL ORIENTATION 42( 9.4.5 EXAMPLES OF EXTRA
SPOTS AND STREAKS 42^ 9.4.6 CONVERGENT-BEAM ELECTRON DIFFRACTION
PATTERNS . . 42 9.4.7 HIGH-ORDER LAUE ZONE (HOLZ) PATTERNS 42( 9.5
FURTHER ANALYTICAL MODES 42* 9.5.1 CATHODOLUMINESCENCE 42{ 9.5.2
ELECTRON-BEAM-INDUCED CURRENT (EBIC) 42 10. SPECIMEN DAMAGE BY ELECTRON
IRRADIATION 431 10.1 SPECIMEN HEATING 431 10.1.1 METHODS OF MEASURING
SPECIMEN TEMPERATURE ... 431 10.1.2 GENERATION OF HEAT BY ELECTRON
IRRADIATION 43: 10.1.3 CALCULATION OF SPECIMEN TEMPERATURE 43! CONTENTS
XIII 10.2 RADIATION DAMAGE OF ORGANIC SPECIMENS 439 10.2.1 ELEMENTARY
DAMAGE PROCESSES IN ORGANIC SPECIMENS 439 10.2.2 QUANTITATIVE METHODS OF
MEASURING DAMAGE EFFECTS 443 10.2.3 METHODS OF REDUCING THE RADIATION
DAMAGE RATE . 450 10.2.4 RADIATION DAMAGE AND HIGH RESOLUTION 452 10.3
RADIATION DAMAGE OF INORGANIC SPECIMENS 453 10.3.1 DAMAGE BY ELECTRON
EXCITATION 453 10.3.2 RADIATION DAMAGE BY KNOCK-ON COLLISIONS 455 10.4
CONTAMINATION 457 10.4.1 ORIGIN AND SOURCES OF CONTAMINATION 457 10.4.2
METHODS FOR DECREASING CONTAMINATION 458 10.4.3 DEPENDENCE OF
CONTAMINATION ON IRRADIATION CONDITIONS 460 REFERENCES 465 SUBJECTLNDEX
537
|
| any_adam_object | 1 |
| author | Reimer, Ludwig 1928- |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- |
| author_role | aut |
| author_sort | Reimer, Ludwig 1928- |
| author_variant | l r lr |
| building | Verbundindex |
| bvnumber | BV001834440 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.T7 |
| callnumber-search | QH212.T7 |
| callnumber-sort | QH 3212 T7 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 5100 UH 6300 |
| classification_tum | PHY 135f CHE 264f |
| ctrlnum | (OCoLC)18959918 (DE-599)BVBBV001834440 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Chemie |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV001834440 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:36:25Z |
| institution | BVB |
| isbn | 3540504990 0387504990 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001220260 |
| oclc_num | 18959918 |
| open_access_boolean | |
| owner | DE-384 DE-20 DE-29T DE-188 DE-83 |
| owner_facet | DE-384 DE-20 DE-29T DE-188 DE-83 |
| physical | XIII, 547 S. Ill., zahlr. graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer 2. ed. Berlin [u.a.] Springer 1989 XIII, 547 S. Ill., zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 36 Literaturverz. S. 465 - 536 Microscopie électronique - Transmission ram Microscopie électronique à transmission Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektron (DE-588)4125978-6 gnd rswk-swf Physik (DE-588)4045956-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektron (DE-588)4125978-6 s 1\p DE-604 Physik (DE-588)4045956-1 s 2\p DE-604 Beugung (DE-588)4145094-2 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Kristallstruktur (DE-588)4136176-3 s 5\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 6\p DE-604 Erscheint auch als Online-Ausgabe 978-3-662-21579-1 Springer series in optical sciences 36 (DE-604)BV000000237 36 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001220260&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reimer, Ludwig 1928- Transmission electron microscopy physics of image formation and microanalysis Springer series in optical sciences Microscopie électronique - Transmission ram Microscopie électronique à transmission Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Beugung (DE-588)4145094-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4136176-3 (DE-588)4169804-6 (DE-588)4125978-6 (DE-588)4045956-1 (DE-588)4215608-7 (DE-588)4145094-2 (DE-588)4014327-2 |
| title | Transmission electron microscopy physics of image formation and microanalysis |
| title_auth | Transmission electron microscopy physics of image formation and microanalysis |
| title_exact_search | Transmission electron microscopy physics of image formation and microanalysis |
| title_full | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Microscopie électronique - Transmission ram Microscopie électronique à transmission Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Beugung (DE-588)4145094-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Microscopie électronique - Transmission Microscopie électronique à transmission Transmission electron microscopy Kristallstruktur Mikroanalyse Elektron Physik Durchstrahlungselektronenmikroskopie Beugung Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001220260&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis |