Image and signal processing in electron microscopy: proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Chicago, IL
Scanning Microscopy Internat.
1988
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| Schriftenreihe: | Scanning microscopy / Supplement
2 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | 396, XI S. Ill., graph. Darst. |
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Datensatz im Suchindex
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| adam_text | IMAGE AND SIGNAL PROCESSING IN ELECTRON MICROSCOPY PROCEEDINGS OF THE
6TH PFEFFERKORN CONFERENCE, HELD APRIL 28 TO MAY 2, 1987, AT NIAGARA
FALLS, CANADA EDITED BY PETER W. HAWKES F. PETER OTTENSMEYER W. OWEN
SAXTON AZRIEL ROSENFELD MANAGING EDITORS JOHN D. FAIRING AND ELIZABETH
A. FAIRING SCANNING MICROSCOPY SUPPLEMENT 2, 1988 PUBLISHED BY SCANNING
MICROSCOPY INTERNATIONAL (PREVIOUSLY SCANNING ELECTRON MICROSCOPY, INC.)
P.O. BOX 66507 AMF O HARE (CHICAGO), IL 60666, U.S.A. SCANNING
MICROSCOPY SUPPLEMENT 2, 1988 ISSN 0892-953X SCANNING MICROSCOPY
INTERNATIONAL, CHICAGO (AMF O HARE), IL 60666, USA IMAGE AND SIGNAL
PROCESSING IN ELECTRON MICROSCOPY T A B L E O F C O N T E N T S ABOUT
SCANNING MICROSCOPY INTERNATIONAL II FOREWORD III PFEFFERKORN
CONFERENCES VI IMAGE CODING M. KUNT 1 TWO-DIMENSIONAL DISCRETE GAUSSIAN
MARKOV RANDOM FIELD MODELS FOR IMAGE PROCESSING R. CHELLAPPA 31
SEGMENTATION AND ITS PLACE IN MACHINE VISION R.M. HARALICK, L.G. SHAPIRO
39 SHAPE A. ROSENFELD 55 NUMERICAL RECONSTRUCTION OF THE ELECTRON OBJECT
WAVE FROM AN ELECTRON HOLOGRAM INCLUDING THE CORRECTION OF ABERRATIONS
F.J. FRANKE, K.-H. HERRMANN, H. LICHTE 59 IMPROVEMENTS IN THE USE OF
SYNTHETIC HOLOGRAMS IN COHERENT IMAGE PROCESSING FOR HIGH RESOLUTION
MICROGRAPHS OF A 100 KILOVOLTS CONVENTIONAL ELECTRON MICROSCOPE E.
REUBER, W. KUNATH, H. BLOCK, B. SCHMIDT, S. BOSECK 69 MAXIMUM ENTROPY
METHODS IN DARK FIELD ELECTRON MICROGRAPHS AND ELEMENTAL MAPS N.A.
FARROW, F.P. OTTENSMEYER 75 SIGNAL PROCESSING FOR AUTOFOCUSING BY BEAM
TILT INDUCED IMAGE DISPLACEMENT A.J. KOSTER, A. VAN DEN BOS, K.D. VAN
DER MAST 83 STRUCTURE DETERMINATION BY HIGH RESOLUTION ELECTRON
MICROSCOPY AND CRYSTALLOGRAPHIC IMAGE PROCESSING (CIP) S. HOVMFILLER 93
THE MAXIMUM ENTROPY METHOD APPLIED TO INTENSITY DATA R.K. BRYAN 99 A
COMPARISION OF THE MAXIMUM ENTROPY (ME), MAXIMUM A POSTERIORI (MAP) AND
MEDIAN WINDOW (MW) RESTORING ALOGRITHMS B.R. FRIEDEN 107 APPLICATION OF
HYPOTHESIS TESTING TO ELECTRON MICROSCOPY H.A. FERWERDA, C.H. SLUMP 113
NEW ASPECTS IN NONLINEAR IMAGE PROCESSING FOR HIGH RESOLUTION ELECTRON
MICROSCOPY W. COENE, D. VAN DYCK 117 DIRECT STRUCTURE RETRIEVAL FROM
HIGH RESOLUTION ELECTRON MICROGRAPHS D. VAN DYCK, W. COENE HIGH
RESOLUTION IMAGE PROCESSING OF ELECTRON MICROGRAPHS E.J. KIRKLAND
DEBLURRING SHOULD NOW BE AUTOMATIC R.H.T. BATES, R.G. LANE RELATIVE
ENTROPY OF AMORPHOUS IMAGES G.Y. FAN MATHEMATICAL MORPHOLOGY AND
MATERIALS IMAGE ANALYSIS D. JEULIN IV ROBUST STATISTICAL METHODS IN
IMAGE PROCESSING D. VAN DYCK, F. VAN DEN PLAS, W. COENE, H. ZANDBERGEN
185 TOWARDS A DIGITAL MODEL FOR AN ELECTRON-MICROSCOPE IMAGE R.E. BURGE,
S.M. ALI 191 ACCURATE ATOM POSITIONS FROM FOCAL AND TILTED BEAM SERIES
OF HIGH RESOLUTION ELECTRON MICROGRAPHS W.O. SAXTON 213 ADVANCES IN
HIGH-RESOLUTION IMAGE SIMULATION M.A. O KEEFE, R. KILAAS 225 THE USE OF
FOURIER TECHNIQUES IN ELECTRON ENERGY-LOSS SPECTROSCOPY R.F. EGERTON,
P.A. CROZIER 245 DECONVOLUTION OF PLASMON SPECTRA P. SCHATTSCHNEIDER, F.
FOEDERMAYR, D.S. SU 255 PLASMON LOSS SPECTROSCOPY - AN APPLICATION TO
QUASICRYSTALS D.C. JOY, C.H. CHEN 271 ESTIMATION OF MISSING CONE DATA IN
THREE-DIMENSIONAL ELECTRON MICROSCOPY M. BARTH, R.K. BRYAN, R. HEGERL,
W. BAUMEISTER 277 PROCESSING OF QUANTITATIVE SCANNING TRANSMISSION
ELECTRON MICROGRAPHS A. ENGEL, R. REICHELT 285 BIOLOGICAL MACROMOLECULES
EXPLORED BY PATTERN RECOGNITION M. VAN HEEL, G. HARAUZ 295
THREE-DIMENSIONAL RECONSTRUCTION FROM SERIAL SECTION IMAGES BY COMPUTER
GRAPHICS N. BABA, K. KANAYA 303 APPLICATION OF ELECTRON ENERGY-LOSS
SPECTROSCOPY TO THE DETERMINATION OF OXIDATION STATES M.T. OTTEN 315
EXTENDED ENERGY-LOSS FINE STRUCTURE STUDIES (EXELFS) WITH PARALLEL
RECORDING A.J. BOURDILLON, G.P. TEBBY 323 EVALUATION AND OPTIMIZATION OF
THE PERFORMANCE OF ELASTIC AND INELASTIC SCANNING TRANSMISSION ELECTRON
MICROSCOPE IMAGING BY CORRELATION ANALYSIS C. MORY, N. BONNET, C.
COLLIEX, H. KOHL, M. TENCE 329 SPECTRAL PROCESSING FOR PARALLEL
RECORDING OF ELEMENTAL MAPS F.P. OTTENSMEYER, B.W. FRANKLAND 343
DEVELOPMENTS IN PROCESSING IMAGE SEQUENCES FOR ELEMENTAL MAPPING N.
BONNET, C. COLLIEX, C. MORY, M. TENCE 351 IMAGING OF CALCIUM IN
BIOLOGICAL SPECIMENS: ROLE OF ELECTRON ENERGY LOSS SPECTROSCOPY G.T.
SIMON, Y.M. HENG 365 CAN ENERGY DISPERSIVE X-RAY SPECTROSCOPY COMPETE
WITH ELECTRON ENERGY LOSS SPECTROSCOPY? D.C. JOY 375 IMAGE
INTERPRETATION OF METAL SHADOWED SPECIMENS WITH THE AID OF MONTE CARLO
SIMULATION OF THE SHADOWING PROCESS H. WINKLER, H. GROSS 379 QUANTIFYING
FRACTURE SURFACES BY STEREO-PHOTOGRAMMETRY J.D. BRYANT, H.G.F. WILSDORF
387 FUTURE DIRECTIONS IN ELECTRON IMAGE PROCESSING P.W. HAWKES 395 THE
JOURNAL SCANNING MICROSCOPY VII SCANNING MICROSCOPY INTERNATIONAL LIST
OF PUBLICATIONS VIII SUBJECT INDEX IX LIST OF REVIEWERS XI AUTHOR INDEX
XI INSTRUCTIONS FOR AUTHORS FOR SCANNING MICROSCOPY XII
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| spelling | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada ed. by Peter W. Hawkes ... Chicago, IL Scanning Microscopy Internat. 1988 396, XI S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Scanning microscopy / Supplement 2 Image Processing, Computer-Assisted methods Image processing Congresses Microscopy, Electron, Scanning methods Scanning electron microscopes Signal Processing, Computer-Assisted Signal processing Congresses Signalverarbeitung (DE-588)4054947-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Bildverarbeitung (DE-588)4006684-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1987 Niagara Falls Ontario gnd-content Elektronenmikroskopie (DE-588)4014327-2 s Bildverarbeitung (DE-588)4006684-8 s DE-604 Signalverarbeitung (DE-588)4054947-1 s Hawkes, Peter W. Sonstige oth Pfefferkorn Conference 6 1987 Niagara Falls, Ontario Sonstige (DE-588)5039940-8 oth Supplement Scanning microscopy 2 (DE-604)BV000886716 2 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=001199370&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada Image Processing, Computer-Assisted methods Image processing Congresses Microscopy, Electron, Scanning methods Scanning electron microscopes Signal Processing, Computer-Assisted Signal processing Congresses Signalverarbeitung (DE-588)4054947-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Bildverarbeitung (DE-588)4006684-8 gnd |
| subject_GND | (DE-588)4054947-1 (DE-588)4014327-2 (DE-588)4006684-8 (DE-588)1071861417 |
| title | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada |
| title_auth | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada |
| title_exact_search | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada |
| title_full | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada ed. by Peter W. Hawkes ... |
| title_fullStr | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada ed. by Peter W. Hawkes ... |
| title_full_unstemmed | Image and signal processing in electron microscopy proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada ed. by Peter W. Hawkes ... |
| title_short | Image and signal processing in electron microscopy |
| title_sort | image and signal processing in electron microscopy proceedings of the 6th pfefferkorn conference held april 28 to may 2 1987 at niagara falls canada |
| title_sub | proceedings of the 6th Pfefferkorn Conference, held April 28 to May 2, 1987, at Niagara Falls, Canada |
| topic | Image Processing, Computer-Assisted methods Image processing Congresses Microscopy, Electron, Scanning methods Scanning electron microscopes Signal Processing, Computer-Assisted Signal processing Congresses Signalverarbeitung (DE-588)4054947-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Bildverarbeitung (DE-588)4006684-8 gnd |
| topic_facet | Image Processing, Computer-Assisted methods Image processing Congresses Microscopy, Electron, Scanning methods Scanning electron microscopes Signal Processing, Computer-Assisted Signal processing Congresses Signalverarbeitung Elektronenmikroskopie Bildverarbeitung Konferenzschrift 1987 Niagara Falls Ontario |
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