Rastertunnelmikroskopie an Si-Einkristalloberflächen:
Gespeichert in:
1. Verfasser: | |
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Format: | Abschlussarbeit Buch |
Sprache: | German |
Veröffentlicht: |
1988
|
Schlagworte: | |
Beschreibung: | 112 S. Ill. |
Internformat
MARC
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049 | |a DE-12 |a DE-19 |a DE-91 |a DE-384 |a DE-703 |a DE-355 |a DE-29T |a DE-83 |a DE-11 |a DE-188 | ||
084 | |a PHY 136d |2 stub | ||
084 | |a PHY 697d |2 stub | ||
084 | |a PHY 608d |2 stub | ||
100 | 1 | |a Berghaus, Thomas |e Verfasser |4 aut | |
245 | 1 | 0 | |a Rastertunnelmikroskopie an Si-Einkristalloberflächen |
264 | 1 | |c 1988 | |
300 | |a 112 S. |b Ill. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
502 | |a Bochum, Univ., Diss., 1988 | ||
650 | 0 | 7 | |a Kristall |0 (DE-588)4033209-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Oberfläche |0 (DE-588)4042907-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Kristallfläche |0 (DE-588)4151344-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
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689 | 1 | 2 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |D s |
689 | 1 | |5 DE-604 | |
940 | 1 | |q TUB-nveb | |
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Datensatz im Suchindex
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---|---|
any_adam_object | |
author | Berghaus, Thomas |
author_facet | Berghaus, Thomas |
author_role | aut |
author_sort | Berghaus, Thomas |
author_variant | t b tb |
building | Verbundindex |
bvnumber | BV001290225 |
classification_tum | PHY 136d PHY 697d PHY 608d |
ctrlnum | (OCoLC)643814846 (DE-599)BVBBV001290225 |
discipline | Physik |
format | Thesis Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV001290225 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:26:29Z |
institution | BVB |
language | German |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000778108 |
oclc_num | 643814846 |
open_access_boolean | |
owner | DE-12 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-384 DE-703 DE-355 DE-BY-UBR DE-29T DE-83 DE-11 DE-188 |
owner_facet | DE-12 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-384 DE-703 DE-355 DE-BY-UBR DE-29T DE-83 DE-11 DE-188 |
physical | 112 S. Ill. |
psigel | TUB-nveb |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
record_format | marc |
spelling | Berghaus, Thomas Verfasser aut Rastertunnelmikroskopie an Si-Einkristalloberflächen 1988 112 S. Ill. txt rdacontent n rdamedia nc rdacarrier Bochum, Univ., Diss., 1988 Kristall (DE-588)4033209-3 gnd rswk-swf Oberfläche (DE-588)4042907-6 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Kristallfläche (DE-588)4151344-7 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Kristall (DE-588)4033209-3 s Oberfläche (DE-588)4042907-6 s Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 Kristallfläche (DE-588)4151344-7 s |
spellingShingle | Berghaus, Thomas Rastertunnelmikroskopie an Si-Einkristalloberflächen Kristall (DE-588)4033209-3 gnd Oberfläche (DE-588)4042907-6 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Kristallfläche (DE-588)4151344-7 gnd Silicium (DE-588)4077445-4 gnd |
subject_GND | (DE-588)4033209-3 (DE-588)4042907-6 (DE-588)4252995-5 (DE-588)4151344-7 (DE-588)4077445-4 (DE-588)4113937-9 |
title | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_auth | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_exact_search | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_full | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_fullStr | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_full_unstemmed | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_short | Rastertunnelmikroskopie an Si-Einkristalloberflächen |
title_sort | rastertunnelmikroskopie an si einkristalloberflachen |
topic | Kristall (DE-588)4033209-3 gnd Oberfläche (DE-588)4042907-6 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Kristallfläche (DE-588)4151344-7 gnd Silicium (DE-588)4077445-4 gnd |
topic_facet | Kristall Oberfläche Rastertunnelmikroskopie Kristallfläche Silicium Hochschulschrift |
work_keys_str_mv | AT berghausthomas rastertunnelmikroskopieansieinkristalloberflachen |