Physical measurement and analysis of thin films: [selected papers from the 1967 Eastern Analytical Symposium]
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Plenum Press
1969
|
| Schriftenreihe: | Progress in analytical chemistry
2 |
| Schlagworte: | |
| Beschreibung: | XI, 194 S. Ill., graph. Darst. |
Internformat
MARC
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| 245 | 1 | 0 | |a Physical measurement and analysis of thin films |b [selected papers from the 1967 Eastern Analytical Symposium] |c ed. by E. M. Murt ... |
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Datensatz im Suchindex
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| id | DE-604.BV000929160 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:21:25Z |
| institution | BVB |
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| language | English |
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| physical | XI, 194 S. Ill., graph. Darst. |
| publishDate | 1969 |
| publishDateSearch | 1969 |
| publishDateSort | 1969 |
| publisher | Plenum Press |
| record_format | marc |
| series | Progress in analytical chemistry |
| series2 | Progress in analytical chemistry |
| spelling | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] ed. by E. M. Murt ... New York Plenum Press 1969 XI, 194 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Progress in analytical chemistry 2 Physikalische Analyse (DE-588)4121477-8 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Dünne Schicht (DE-588)4136925-7 s DE-604 Physikalische Analyse (DE-588)4121477-8 s Murt, Edward M. Sonstige oth Eastern Analytical Symposium 1967 New York, NY Sonstige (DE-588)806583-4 oth Progress in analytical chemistry 2 (DE-604)BV000893246 2 |
| spellingShingle | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] Progress in analytical chemistry Physikalische Analyse (DE-588)4121477-8 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4121477-8 (DE-588)4136925-7 (DE-588)1071861417 |
| title | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] |
| title_auth | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] |
| title_exact_search | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] |
| title_full | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] ed. by E. M. Murt ... |
| title_fullStr | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] ed. by E. M. Murt ... |
| title_full_unstemmed | Physical measurement and analysis of thin films [selected papers from the 1967 Eastern Analytical Symposium] ed. by E. M. Murt ... |
| title_short | Physical measurement and analysis of thin films |
| title_sort | physical measurement and analysis of thin films selected papers from the 1967 eastern analytical symposium |
| title_sub | [selected papers from the 1967 Eastern Analytical Symposium] |
| topic | Physikalische Analyse (DE-588)4121477-8 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | Physikalische Analyse Dünne Schicht Konferenzschrift |
| volume_link | (DE-604)BV000893246 |
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